Beamline for surface and interface structures at SPring-8

被引：141

作者：

Sakata, O

Furukawa, Y

Goto, S

Mochizuki, T

Uruga, T

Takeshita, K

Ohashi, H

Ohata, T

Matsushita, T

Takahashi, S

Tajiri, H

Ishikawa, T

Nakamura, M

Ito, M

Sumitani, K

Takahashi, T

Shimura, T

Saito, A

Takahashi, M

机构：

[1] Japan Synchrotron Radiat Res Inst, JASRI, Kouto, Mikazuki 6795198, Japan

[2] JASRI, Kouto, Mikazuki 6795148, Japan

[3] RIKEN, Harima Inst, Kouto, Mikazuki 6795148, Japan

[4] Keio Univ, Yokohama, Kanagawa 2238522, Japan

[5] Univ Tokyo, Kashiwa, Chiba 2778581, Japan

[6] Osaka Univ, Suita, Osaka 5650871, Japan

[7] Japan Atom Energy Res Inst, Kouto, Mikazuki 6795198, Japan

来源：

SURFACE REVIEW AND LETTERS | 2003年 / 10卷 / 2-3期

关键词：

D O I：

10.1142/S0218625X03004809

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The main components of a new beamline for surface and interface crystal structure determination at SPring-8 are briefly described. Stages for the beamline monochromator are modified for making an incident X-ray intensity more stable for surface X-ray experiments. Absolute photon flux densities were measured with an incident photon energy. A new ultrahigh vacuum system is introduced with preliminary X-ray measurements from an ordered oxygen on Pt (111) surface.

引用

页码：543 / 547

页数：5

共 15 条

[1] MODEL-INDEPENDENT STRUCTURE DETERMINATION OF THE INSB(111)2X2 SURFACE WITH USE OF SYNCHROTRON X-RAY-DIFFRACTION
BOHR, J
FEIDENHANSL, R
NIELSEN, M
TONEY, M
JOHNSON, RL
ROBINSON, IK
[J]. PHYSICAL REVIEW LETTERS, 1985, 54 (12) : 1275 - 1278
[2] A NOVEL X-RAY-SCATTERING DIFFRACTOMETER FOR STUDYING SURFACE-STRUCTURES UNDER UHV CONDITIONS
BRENNAN, S
EISENBERGER, P
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 222 (1-2) : 164 - 167
[3] X-RAY-DIFFRACTION STUDY OF THE GE(001) RECONSTRUCTED SURFACE
EISENBERGER, P
MARRA, WC
[J]. PHYSICAL REVIEW LETTERS, 1981, 46 (16) : 1081 - 1084
[4] ANGLE CALCULATIONS FOR A 2+2 SURFACE X-RAY DIFFRACTOMETER
EVANSLUTTERODT, KW
TANG, MT
[J]. JOURNAL OF APPLIED CRYSTALLOGRAPHY, 1995, 28 : 318 - 326
[5] APPARATUS FOR X-RAY-DIFFRACTION IN ULTRAHIGH-VACUUM
FUOSS, PH
ROBINSON, IK
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 222 (1-2) : 171 - 176
[6] GOTO S, 2000, SPRING 8 INFORMATION, V5, P100
[7] Recent trends of insertion-device technology for X-ray sources
Kitamura, H
[J]. JOURNAL OF SYNCHROTRON RADIATION, 2000, 7 (03) : 121 - 130
[8] LYMAN PF, 1997, AIP C P, V417, P10
[9] RELIABILITY OF DETAILED LEED STRUCTURAL-ANALYSES - PT(111) AND PT(111)-P(2X2)-O
MATERER, N
STARKE, U
BARBIERI, A
DOLL, R
HEINZ, K
VANHOVE, MA
SOMORJAI, GA
[J]. SURFACE SCIENCE, 1995, 325 (03) : 207 - 222
[10] Cryogenic cooling monochromators for the SPring-8 undualtor beamlines
Mochizuki, T
Kohmura, Y
Awaji, A
Suzuki, Y
Baron, A
Tamasaku, K
Yabashi, M
Yamazaki, H
Ishikawa, T
[J]. NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 2001, 467 : 647 - 649

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