Concurrent RIF test using optimized modulated RF stimuli

被引：17

作者：

Cherubal, S ^{[1
]}

Voorakaranam, R ^{[1
]}

Chatterjee, A ^{[1
]}

Mclaughlin, J ^{[1
]}

Smith, JL ^{[1
]}

Majernik, DM ^{[1
]}

机构：

[1] Ardext Technol, Tucson, AZ 85704 USA

来源：

17TH INTERNATIONAL CONFERENCE ON VLSI DESIGN, PROCEEDINGS: DESIGN METHODOLOGIES FOR THE GIGASCALE ERA | 2004年

关键词：

D O I：

10.1109/ICVD.2004.1261063

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

With proliferation in wireless applications, RF circuitry is being included in a large number of Integrated Circuit (IC) designs. The testing of RF devices has become increasingly expensive due to the high cost of RF testers as well as the test times for RF circuits. The use of a new concurrent test methodology reduces RF test time by measuring multiple RF parameters in parallel using modulated RF stimuli. Experimental results on a GaAs Low-Noise Amplifier (LNA) are described.

引用

页码：1017 / 1022

页数：6

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