From angle-resolved ellipsometry of light scattering to imaging in random media

被引：3
|
作者：
Georges, Gaelle [1 ]
Arnaud, Laurent [1 ]
Siozade, Laure [1 ]
Le Neindre, Nora [1 ]
Chazallet, Frederic [2 ]
Zerrad, Myriam [1 ]
Deumie, Carole [1 ]
Amra, Claude [1 ]
机构：
[1] Univ Aix Marseille 1, Ecole Cent Marseille, Univ Paul Cezanne, CNRS ST2I 6133,Unit Mixte Rech,Inst Fresnel,Fac S, F-13397 Marseille 20, France
[2] SHAKTI SA, F-13014 Marseille, France
来源：
APPLIED OPTICS | 2008年 / 47卷 / 13期
关键词：
D O I：
10.1364/AO.47.00C257
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A procedure is described to allow selective cancellation of polarized scattering within optical substrates and multilayers. It is shown how bulk scattering (respectively surface) can be directly eliminated while the remaining roughness (respectively bulk) signal is still measurable. The same procedure can be applied to isolate a single interface or bulk within a stack or to detect slight departure from perfect correlation within multilayers. Experiments and a procedure for selective imaging in random media are described. (c) 2008 Optical Society of America.
引用
收藏
页码：C257 / C265
页数：9
相关论文
共 50 条
  • [1] Angle-resolved light scattering from semiconductors
    Sterligov, VA
    PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1998, 170 (02): : 443 - 450
  • [2] Angle-resolved ellipsometry of scattering patterns from arbitrary surfaces and bulks
    Gilbert, O
    Deumié, C
    Amra, C
    OPTICS EXPRESS, 2005, 13 (07): : 2403 - 2418
  • [3] Angle-resolved ellipsometry of light scattering:: discrimination of surface and bulk effects in substrates and optical coatings
    Deumié, C
    Giovannini, H
    Amra, C
    APPLIED OPTICS, 2002, 41 (16) : 3362 - 3369
  • [4] Impact of light polarization on angle-resolved light scattering from gloss scale
    Gozhyk, I
    Turbil, C.
    Garcia, E.
    Obein, G.
    PHYSICA SCRIPTA, 2023, 98 (09)
  • [5] Extinction and angle-resolved light scattering from aggregated metal clusters
    Kahlau, T
    Quinten, M
    Kreibig, U
    APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1996, 62 (01): : 19 - 27
  • [6] Microscope enabling multimodality imaging, angle-resolved scattering, and scattering spectroscopy
    Cottrell, W. J.
    Wilson, J. D.
    Foster, T. H.
    OPTICS LETTERS, 2007, 32 (16) : 2348 - 2350
  • [7] Angle-resolved light scattering from textured injection-molded plastics
    Ignell, Sofie
    Rigdahl, Mikael
    JOURNAL OF APPLIED POLYMER SCIENCE, 2012, 124 (02) : 1624 - 1633
  • [8] Angle-resolved second-harmonic light scattering from colloidal particles
    Yang, N
    Angerer, WE
    Yodh, AG
    PHYSICAL REVIEW LETTERS, 2001, 87 (10) : art. no. - 103902
  • [9] Single-shot multispectral angle-resolved ellipsometry
    Choi, Garam
    Lee, Seung Woo
    Lee, Sin Yong
    Pahk, Heui Jae
    APPLIED OPTICS, 2020, 59 (21) : 6296 - 6303
  • [10] Estimation of the scattering coefficients of turbid media using angle-resolved optical frequency-domain imaging
    Desjardins, A. E.
    Vakoc, B. J.
    Bilenca, A.
    Tearney, G. J.
    Bouma, B. E.
    OPTICS LETTERS, 2007, 32 (11) : 1560 - 1562
12345