Vertical oxide thin-film transistor with interfacial oxidation

被引:10
作者
Baek, Yeong Jo [1 ]
Kang, In Hye [1 ]
Hwang, Sang Ho [1 ]
Han, Ye Lin [1 ]
Kang, Min Su [1 ]
Kang, Seok Jun [1 ]
Kim, Seo Gwon [1 ]
Woo, Jae Geun [1 ]
Yu, Eun Seong [1 ]
Seong, Byung [1 ]
机构
[1] Hoseo Univ, Sch Elect & Display Engn, Asan 31499, Chungnam, South Korea
基金
新加坡国家研究基金会;
关键词
D O I
10.1038/s41598-022-07052-3
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
A vertical oxide thin-film transistor was developed with interfacial oxidation for low voltage operation. The gate metal was used as a spacer for the definition of the transistor's channel as well as the gate electrode. After definition of the vertical side wall, an IGZO (In-Ga-Zn Oxide) layer was deposited, followed by the interfacial oxidation to form a thin gate insulator. Ta was used for the gate material due to the low Gibbs free energy and high dielectric constant of tantalum oxide. A 15 nm tantalum oxide layer was obtained by the interfacial oxidation of Ta at 400 degrees C under oxygen atmosphere. The thin gate oxide made it possible to operate the transistor under 1 V. The low operation voltage enables low power consumption, which is essential for mobile application.
引用
收藏
页数:8
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共 27 条
[1]   One-Volt IGZO Thin-Film Transistors With Ultra-Thin, Solution-Processed AlxOy Gate Dielectric [J].
Cai, Wensi ;
Park, Seonghyun ;
Zhang, Jiawei ;
Wilson, Joshua ;
Li, Yunpeng ;
Xin, Qian ;
Majewski, Leszek ;
Song, Aimin .
IEEE ELECTRON DEVICE LETTERS, 2018, 39 (03) :375-378
[2]   High-performance poly-Si TFT with ultra-thin channel film and gate oxide for low-power application [J].
Chen, Yi-Hsuan ;
Ma, William Cheng-Yu ;
Chao, Tien-Sheng .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2015, 30 (10)
[3]   High-Performance a-IGZO Thin-Film Transistor Using Ta2O5 Gate Dielectric [J].
Chiu, C. J. ;
Chang, S. P. ;
Chang, S. J. .
IEEE ELECTRON DEVICE LETTERS, 2010, 31 (11) :1245-1247
[4]   Correlation between Ti source/drain contact and performance of InGaZnO-based thin film transistors [J].
Choi, Kwang-Hyuk ;
Kim, Han-Ki .
APPLIED PHYSICS LETTERS, 2013, 102 (05)
[5]   Implementation of Low-Power Electronic Devices Using Solution-Processed Tantalum Pentoxide Dielectric [J].
Heo, Jungwoo ;
Park, Song Yi ;
Kim, Jae Won ;
Song, Seyeong ;
Yoon, Yung Jin ;
Jeong, Jaeki ;
Jang, Hyungsu ;
Lee, Kang Taek ;
Seo, Jung Hwa ;
Walker, Bright ;
Kim, Jin Young .
ADVANCED FUNCTIONAL MATERIALS, 2018, 28 (28)
[6]   Highly Sensitive Active-Matrix Driven Self-Capacitive Fingerprint Sensor based on Oxide Thin Film Transistor [J].
Jeon, Guk-Jin ;
Lee, Seung-Hwan ;
Lee, Seung Hee ;
Shim, Jun-Bo ;
Ra, Jong-Hyun ;
Park, Kyoung Woo ;
Yeom, Hye-In ;
Nam, Yunyong ;
Kwon, Oh-Kyong ;
Park, Sang-Hee Ko .
SCIENTIFIC REPORTS, 2019, 9 (1)
[7]   Low-Temperature Polysilicon Oxide Thin-Film Transistors with Coplanar Structure Using Six Photomask Steps Demonstrating High Inverter Gain of 264 V V-1 [J].
Jeong, Duk Young ;
Chang, Yeoungjin ;
Yoon, Won Gyeong ;
Do, Youngbin ;
Jang, Jin .
ADVANCED ENGINEERING MATERIALS, 2020, 22 (04)
[8]   Highly Robust Flexible Vertical-Channel Thin-Film Transistors Using Atomic-Layer-Deposited Oxide Channels and Zeocoat Spacers on Ultrathin Polyimide Substrates [J].
Kim, Hyeong-Rae ;
Furuta, Mamoru ;
Yoon, Sung-Min .
ACS APPLIED ELECTRONIC MATERIALS, 2019, 1 (11) :2363-2370
[9]   Flexible vertical-channel thin-film transistors using In-Ga-Zn-O active channel and polyimide spacer on poly(ethylene naphthalate) substrate [J].
Kim, Hyeong-Rae ;
Yang, Ji-Hee ;
Kim, Gi-Heon ;
Yoon, Sung-Min .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2019, 37 (01)
[10]   Homojunction Solution-Processed Metal Oxide Thin-Film Transistors Using Passivation-Induced Channel Definition [J].
Kim, Jung Hyun ;
Rim, You Seung ;
Kim, Hyun Jae .
ACS APPLIED MATERIALS & INTERFACES, 2014, 6 (07) :4819-4822