Pulsed thermal NDT in tables, figures and formulas
被引:1
|
作者:
Vavilov, V. P.
论文数: 0引用数: 0
h-index: 0
机构:
Tomsk Polytech Univ, Savinykh St 7, Tomsk 634028, Russia
Tomsk State Univ, Tomsk 634050, RussiaTomsk Polytech Univ, Savinykh St 7, Tomsk 634028, Russia
Vavilov, V. P.
[1
,2
]
Burleigh, D. D.
论文数: 0引用数: 0
h-index: 0
机构:
La Jolla Cove Consulting, San Diego, CA 92117 USATomsk Polytech Univ, Savinykh St 7, Tomsk 634028, Russia
Burleigh, D. D.
[3
]
机构:
[1] Tomsk Polytech Univ, Savinykh St 7, Tomsk 634028, Russia
[2] Tomsk State Univ, Tomsk 634050, Russia
[3] La Jolla Cove Consulting, San Diego, CA 92117 USA
thermal nondestructive testing;
modeling;
data processing;
heat conduction;
D O I:
10.1117/12.2181039
中图分类号:
TM [电工技术];
TN [电子技术、通信技术];
学科分类号:
0808 ;
0809 ;
摘要:
Several reviews and summary papers describing the history and the current status of pulsed thermal nondestructive testing (TNDT have been published recently. However, some of the theoretical possibilities cannot easily be implemented in practical applications. This paper contains useful tables and formulas that are illustrated with typical IR thermograms to provide a general overlook of pulsed TNDT.