Pulsed thermal NDT in tables, figures and formulas

被引:1
|
作者
Vavilov, V. P. [1 ,2 ]
Burleigh, D. D. [3 ]
机构
[1] Tomsk Polytech Univ, Savinykh St 7, Tomsk 634028, Russia
[2] Tomsk State Univ, Tomsk 634050, Russia
[3] La Jolla Cove Consulting, San Diego, CA 92117 USA
关键词
thermal nondestructive testing; modeling; data processing; heat conduction;
D O I
10.1117/12.2181039
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Several reviews and summary papers describing the history and the current status of pulsed thermal nondestructive testing (TNDT have been published recently. However, some of the theoretical possibilities cannot easily be implemented in practical applications. This paper contains useful tables and formulas that are illustrated with typical IR thermograms to provide a general overlook of pulsed TNDT.
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页数:15
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