Beam test of BTeV pixel detectors

被引：2

作者：

Wang, JC ^{[1
]}

Appel, JA

Artuso, M

Butler, JN

Cancelo, G

Cardoso, G

Cheung, H

Chiodini, G

Christian, DC

Colautti, A

Coluccia, R

Di Corato, M

Gottschalk, EE

Hall, BK

Hoff, J

Kasper, PA

Kutschke, R

Kwan, SW

Mekkaoui, A

Menasce, D

Newsom, C

Sala, S

Yarema, R

Zimmermann, S

机构：

[1] Syracuse Univ, Dept Phys, Syracuse, NY 13244 USA

[2] Fermilab Natl Accelerator Lab, Batavia, IL 60510 USA

[3] Sez INFN, I-20133 Milan, Italy

[4] Univ Milan, Dipartimento Fis, I-20133 Milan, Italy

[5] Univ Iowa, Iowa City, IA 52242 USA

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2001年 / 473卷 / 1-2期

关键词：

BTeV; pixel; silicon;

D O I：

10.1016/S0168-9002(01)01131-7

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The silicon pixel vertex detector is one of the key elements of the BTeV spectrometer. Detector prototypes were tested in a beam at Fermilab. We report here on the measured spatial resolution as a function of the incident angles for different sensor-readout electronics combinations, We compare the results with predictions from our Monte Carlo simulation. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：119 / 123

页数：5

共 11 条

[1]

ARTUSO M, HEPEX0007054

[2]

CHIODINI G, HEPEX0009023

[3] FPIX2: a radiation-hard pixel readout chip for BTeV [J].