Sign tests for long-memory time series

被引:3
|
作者
Delgado, MA [1 ]
Velasco, C [1 ]
机构
[1] Univ Carlos III Madrid, Dept Econ, Madrid 28903, Spain
关键词
exact tests; nonparametric tests; infinite variance; long-range dependence; fractional processes; nonstationarity; optimal tests;
D O I
10.1016/j.jeconom.2004.08.013
中图分类号
F [经济];
学科分类号
02 ;
摘要
This paper proposes sign-based tests for simple and composite hypotheses on the long-memory parameter of a time series process. The tests allow for nonstationary hypothesis, such as unit root, as well as for stationary hypotheses, such as weak dependence or no integration. The proposed generalized Lagrange multiplier sign tests for simple hypotheses on the long-memory parameter are exact and locally optimal among those in their class. We also propose tests for composite hypotheses on the parameters of ARFIMA(p, d, q) processes. The resulting tests statistics have a standard normal limiting distribution under the null hypothesis. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:215 / 251
页数:37
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