Piezoresponse force microscopy studies of switching behavior of ferroelectric capacitors on a 100-ns time scale

被引:176
作者
Gruverman, A. [1 ]
Wu, D. [2 ]
Scott, J. F. [3 ]
机构
[1] Univ Nebraska, Dept Phys & Astron, Lincoln, NE 68588 USA
[2] N Carolina State Univ, Dept Phys, Raleigh, NC 27695 USA
[3] Univ Cambridge, Dept Earth Sci, Cambridge CB2 3EQ, England
关键词
D O I
10.1103/PhysRevLett.100.097601
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Piezoresponse force microscopy is a powerful technique for nm-scale studies but is usually limited by response time. In this Letter, we report the first direct studies of ferroelectric capacitor switching on a submicrosecond time scale. Simultaneous domain imaging and sub-mu s transient current measurements establish a direct relationship between polarization P(t) and domain kinetics. Switching times scale with capacitor size over an order of magnitude. Small capacitors, where polarization reversal is dominated by domain wall motion, switch faster at high fields but more slowly at low fields while larger capacitors do the reverse.
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页数:4
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