Steep switching characteristics of single-gated feedback field-effect transistors

被引:48
|
作者
Kim, Minsuk [1 ]
Kim, Yoonjoong [1 ]
Lim, Doohyeok [1 ]
Woo, Sola [1 ]
Cho, Kyoungah [1 ]
Kim, Sangsig [1 ]
机构
[1] Korea Univ, Dept Elect Engn, 145 Anam Ro, Seoul 02841, South Korea
基金
新加坡国家研究基金会;
关键词
feedback field-effect transistors; steep switching characteristics; subthreshold swing; positive feedback loop; NEGATIVE CAPACITANCE; IMPACT-IONIZATION; ENERGY-EFFICIENT; OPERATION; DEVICES; FET;
D O I
10.1088/1361-6528/28/5/055205
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this study, we propose newly designed feedback field-effect transistors that utilize the. positive feedback of charge carriers in single-gated silicon channels to achieve steep switching behaviors. The band diagram, I-V characteristics, subthreshold swing, and on/off current ratio are analyzed using a commercial device simulator. Our proposed feedback field-effect transistors exhibit subthreshold swings of less than 0.1 mV dec(-1), an on/off current ratio of approximately 10(11), and an on-current of approximately 10(-4) A at room temperature, demonstrating that the switching characteristics are superior to those. of other silicon-based devices. In addition, the device parameters that affect the device performance, hysteresis characteristics, and temperature-dependent device characteristics are discussed in detail.
引用
收藏
页数:8
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