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Steep switching characteristics of single-gated feedback field-effect transistors
被引:48
|作者:
Kim, Minsuk
[1
]
Kim, Yoonjoong
[1
]
Lim, Doohyeok
[1
]
Woo, Sola
[1
]
Cho, Kyoungah
[1
]
Kim, Sangsig
[1
]
机构:
[1] Korea Univ, Dept Elect Engn, 145 Anam Ro, Seoul 02841, South Korea
基金:
新加坡国家研究基金会;
关键词:
feedback field-effect transistors;
steep switching characteristics;
subthreshold swing;
positive feedback loop;
NEGATIVE CAPACITANCE;
IMPACT-IONIZATION;
ENERGY-EFFICIENT;
OPERATION;
DEVICES;
FET;
D O I:
10.1088/1361-6528/28/5/055205
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
In this study, we propose newly designed feedback field-effect transistors that utilize the. positive feedback of charge carriers in single-gated silicon channels to achieve steep switching behaviors. The band diagram, I-V characteristics, subthreshold swing, and on/off current ratio are analyzed using a commercial device simulator. Our proposed feedback field-effect transistors exhibit subthreshold swings of less than 0.1 mV dec(-1), an on/off current ratio of approximately 10(11), and an on-current of approximately 10(-4) A at room temperature, demonstrating that the switching characteristics are superior to those. of other silicon-based devices. In addition, the device parameters that affect the device performance, hysteresis characteristics, and temperature-dependent device characteristics are discussed in detail.
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页数:8
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