CCD thermoreflectance spectroscopy as a tool for thermal characterization of quantum cascade lasers

被引：19

作者：

Pierscinska, D. ^{[1
]}

Pierscinski, K. ^{[1
]}

Morawiec, M. ^{[1
]}

Karbownik, P. ^{[1
]}

Gutowski, P. ^{[1
]}

Bugajski, M. ^{[1
]}

机构：

[1] Inst Electr Mat Technol, Al Lotnikow 32-46, PL-02668 Warsaw, Poland

来源：

SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 2016年 / 31卷 / 11期

关键词：

thermal mapping; thermoreflectance spectroscopy; semiconductor lasers; quantum cascade lasers; TEMPERATURE-MEASUREMENTS; REFLECTANCE MODULATION;

D O I：

10.1088/0268-1242/31/11/115006

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The development of charge coupled device thermoreflectance (CCD TR) instrumentation for accurate and rapid evaluation of the thermal characteristics of quantum cascade lasers is demonstrated. The thermal characterization of such devices provides a mode for comparing different operating conditions, geometries and device designs. The method allows for registration of the high-resolution maps of the temperature distribution in a time not exceeding several seconds. The capabilities of the CCD TR are compared with standard TR spectroscopy.

引用

页数：11

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