Influence of structural parameters on the properties of electrolytic Ni-Mn-S deposits

被引：3

作者：

Atanassov, N ^{[1
]}

Schils, HW

机构：

[1] Bulgarian Acad Sci, Inst Phys Chem, BU-1113 Sofia, Bulgaria

[2] Forschungsinst Edelmet & Met Chem, D-73525 Schwabisch Gmund, Germany

来源：

JOURNAL OF APPLIED ELECTROCHEMISTRY | 1999年 / 29卷 / 01期

关键词：

codeposition Ni; Mn; S; X-ray analysis; structure; texture; properties;

D O I：

10.1023/A:1003486714232

中图分类号：

O646 [电化学、电解、磁化学];

学科分类号：

081704 ;

摘要：

Microstructural parameters such as coherent domain size, microstrain, dislocation density and texture of electrolytically plated Ni-Mn-S layers were investigated by X-ray analysis. Structural parameters, layer composition and the macroproperties are discussed and explained. With the help of a statistical regression analysis the correlation coefficient r(2) and its relationship with the investigated parameters is determined. It is shown that the microstructural parameters play an important role in determining the macroscopic properties. The manganese concentration is shown to influence the structural parameters, but no influence of sulphur is found. It seems that a relationship of the structural parameters with the macroscopic properties is valid in general and is not a special case. There structural correlations can be used in general for processing electrolytic deposits for required applications.

引用

页码：51 / 57

页数：7

共 29 条

[1] Electrodeposition and properties of nickel-manganese layers [J].

Atanassov, N ;

Mitreva, V .

SURFACE & COATINGS TECHNOLOGY, 1996, 78 (1-3) :144-149

[2]

Atanassov N, 1996, PLAT SURF FINISH, V83, P49

[3]

ATANASSOV N, 1992, METALLOBERFLACHE, V46, P448

[4]

ATANASSOV N, 1993, GALVANOTECHNIK, V84, P1879

[5]

ATANASSOV N, 1988, GALVANOTECHNIK, V79, P1485

[6]

Bunge H. J., 1982, Texture analysis in materials science: mathematical methods

[7]

BUNGE HJ, 1984, Z METALLKD, V75, P97

[8]

BURGAHN F, 1993, Z METALLKD, V84, P224

[9]

DEKEIJSER TH, 1982, FREIBERGER FORSCH B, V5, P308

[10] DETERMINATION OF CRYSTALLITE SIZE AND LATTICE-DISTORTIONS THROUGH X-RAY-DIFFRACTION LINE-PROFILE ANALYSIS - RECIPES, METHODS AND COMMENTS [J].

DELHEZ, R ;

DEKEIJSER, TH ;

MITTEMEIJER, EJ .

FRESENIUS ZEITSCHRIFT FUR ANALYTISCHE CHEMIE, 1982, 312 (01) :1-16

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