Iterative phase retrieval from kinematic rocking curves in CBED patterns

被引:12
作者
Vincent, R [1 ]
Walsh, TD [1 ]
Pozzi, M [1 ]
机构
[1] Univ Bristol, HH Wills Phys Lab, Bristol BS8 1TL, Avon, England
基金
英国工程与自然科学研究理事会;
关键词
convergent beam electron diffraction (CBED); specimen preparation and handling; exit wave reconstruction;
D O I
10.1016/S0304-3991(98)00076-X
中图分类号
TH742 [显微镜];
学科分类号
摘要
In the two-beam limit, the intensity distribution in the dark held disc of a convergent beam electron diffraction (CBED) pattern represents a rocking curve mapped across the Bragg condition. For kinematic scattering from crystal planes which are bent or displaced within the illuminated column, the diffracted amplitude and phase is the Fourier transform of a phase function with an exponent proportional to the displacement normal to the planes. Recovery of the phase profile is formally equivalent to the one-dimensional phase retrieval problem for an object function with constant modulus within a compact support, given only the diffracted intensity distribution. In simulations using the error reduction algorithm, the computed solution always converged to the original phase profile. As a practical test, the asymmetric rocking curves diffracted from planes inclined to the surfaces in ion-thinned Si specimens were used as the diffraction constraint, with support width equal to the crystal thickness. The calculated displacement curve was S-shaped, interpreted as a dilation of 1% induced by Ar atoms implanted in the surface layers. The factors which limit the accuracy and spatial resolution for phase recovery along the beam direction are discussed. (C) 1999 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:125 / 137
页数:13
相关论文
共 22 条
[1]   Amorphisation and surface morphology development at low-energy ion milling [J].
Barna, A ;
Pécz, B ;
Menyhard, M .
ULTRAMICROSCOPY, 1998, 70 (03) :161-171
[2]   ITERATIVE METHODS FOR IMAGE DEBLURRING [J].
BIEMOND, J ;
LAGENDIJK, RL ;
MERSEREAU, RM .
PROCEEDINGS OF THE IEEE, 1990, 78 (05) :856-883
[3]  
BIRD DM, 1983, I PHYS C SER, V68, P41
[4]   CONVERGENT BEAM DIFFRACTION STUDIES OF INTERFACES, DEFECTS, AND MULTILAYERS [J].
CHERNS, D ;
PRESTON, AR .
JOURNAL OF ELECTRON MICROSCOPY TECHNIQUE, 1989, 13 (02) :111-122
[5]   ELECTRON-DIFFRACTION STUDIES OF STRAIN IN EPITAXIAL BICRYSTALS AND MULTILAYERS [J].
CHERNS, D ;
KIELY, CJ ;
PRESTON, AR .
ULTRAMICROSCOPY, 1988, 24 (04) :355-370
[6]   CONVERGENT-BEAM ELECTRON-DIFFRACTION [J].
CHERNS, D .
JOURNAL DE PHYSIQUE IV, 1993, 3 (C7) :2113-2122
[7]   ENCODING OF INFORMATION IN INVERSE OPTICAL PROBLEMS [J].
FIDDY, MA ;
ROSS, G ;
NIETOVESPERINAS, M ;
HUISER, AMJ .
OPTICA ACTA, 1982, 29 (01) :23-40
[8]   PHASE RETRIEVAL ALGORITHMS - A COMPARISON [J].
FIENUP, JR .
APPLIED OPTICS, 1982, 21 (15) :2758-2769
[9]  
FIENUP JR, 1981, P SOC PHOTO-OPT INS, V373, P237
[10]  
GERCHBERG RW, 1972, OPTIK, V35, P237