On-chip nanostructures for polarization imaging and multispectral sensing using dedicated layers of modified CMOS processes

被引:5
作者
Junger, Stephan [1 ]
Tschekalinskij, Wladimir [1 ]
Verwaal, Nanko [1 ]
Weber, Norbert [1 ]
机构
[1] Fraunhofer Inst Integrated Circuits IIS, Dept Analog IC Dev, D-91058 Erlangen, Germany
来源
PHOTONIC AND PHONONIC PROPERTIES OF ENGINEERED NANOSTRUCTURES | 2011年 / 7946卷
关键词
Nanophotonics; Wire grid polarizer; Sub-wavelength apertures; Plasmons; CMOS process; Polarization sensors; Color sensors; Image sensors;
D O I
10.1117/12.874785
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Sub-wavelength gratings and hole arrays in metal films are applicable for polarization and spectral selective sensors, respectively. We demonstrate the fabrication of wire grid polarizers using standard complementary metal-oxide semiconductor (CMOS) processes. Extraordinary optical transmission of hole arrays was achieved by using the dedicated layer of a modified CMOS process. The structures were simulated using the finite-difference time-domain (FDTD) method and fabricated using the work flow of integrated circuits. A high-speed polarization image sensor with a pixel size of 6 mu m was designed and demonstrated, and multispectral sensing was implemented using nanostructures with different spectral filter performances on a single chip.
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页数:7
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