Effect of excess temperature above liquidus of lead-free solders on wetting time in a wetting balance test

被引:37
作者
Takemoto, T [1 ]
Miyazaki, M [1 ]
机构
[1] Osaka Univ, Collaborat Res Ctr Adv Sci & Technol, Suita, Osaka 5650871, Japan
关键词
lead-free solder; wetting time; melting temperature; tin-silver-bismuth alloy; tin-silver-indium alloy; contact angle; wetting balance;
D O I
10.2320/matertrans.42.745
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A wetting test a as conducted using a wetting balance tester to evaluate the wettability of Sn-Ag and Sn-Zn lead-free solders with the addition of bismuth or indium up to 25 mass%. The base metal and flux used were oxygen-free high-conductivity copper and rosin-based flux containing 0.2 mass%Cl and 35 mass% solid rosin diluted with isopropyl alcohol. The wetting time decreased with increases in the amount of additional elements at a fixed test temperature. The wetting force had only a slight dependence on the element content: Sn-Zn alloys exhibited less wetting force than Sn-Ag. The plots between the excess temperature above liquidus. (test temperature)-(liquidus), and wetting time correlated well. An increase in the excess temperature decreased the wetting time, indicating that the wetting time is closely controlled by the temperature-rising stage of the wetting test specimen. Therefore, a comparison of the contact angles is recommended for precisely evaluating the wettability on lead-free solders. The interfacial tension between the soldering flux and molten solder was measured by a simple method using a wetting balance tester to obtain the contact angle from the wetting balance test. The calculated contact angle in Sn-Ag system solders is smaller than that in Sn-Zn system solders, indicating that Sn-Ag system solders exhibit superior wettability.
引用
收藏
页码:745 / 750
页数:6
相关论文
共 19 条
  • [1] Allenby B. R., 1993, Circuit World, V19, P18, DOI 10.1108/eb046198
  • [2] Allenby B. R., 1993, Circuit World, V19, P25, DOI 10.1108/eb046209
  • [3] [Anonymous], LEAD FREE SOLD PROJ
  • [4] Harris P. G., 1993, Circuit World, V19, P25, DOI 10.1108/eb046199
  • [5] Hua F, 1997, DESIGN & RELIABILITY OF SOLDERS AND SOLDER INTERCONNECTIONS, P65
  • [6] IIDA T, 1994, REPORTS JAPAN SCI TE, V19, P29
  • [7] DISPERSOID ADDITIONS TO A PB-FREE SOLDER FOR SUPPRESSION OF MICROSTRUCTURAL COARSENING
    JIN, S
    MCCORMACK, M
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (08) : 735 - 739
  • [8] ON THE SN-BI-AG TERNARY PHASE-DIAGRAM
    KATTNER, UR
    BOETTINGER, WJ
    [J]. JOURNAL OF ELECTRONIC MATERIALS, 1994, 23 (07) : 603 - 610
  • [9] Lea C, 1988, SCI GUIDE SURFACE MO, P6
  • [10] MCELVEE CS, 1980, P INT NEPCON, P424