Effect of alumina addition on the microstructure of plasma sprayed YSZ

被引:16
作者
Brinkiene, K [1 ]
Kezelis, R [1 ]
机构
[1] Lithuanian Energy Inst, LT-44403 Kaunas, Lithuania
关键词
films; microstructure-final; ZrO2; fuel cells; plasma spraying;
D O I
10.1016/j.jeurceramsoc.2005.03.027
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A plasma spray process for fabricating yttria-stabilized zirconia (YSZ) layers for SOFC was investigated. YSZ powders (CERAC, USA) < 44 mu m in diameter have been used to prepare plasma-sprayed ceramic films on the stainless steel sheets employing non-equilibrium plasma spray technology at atmospheric pressure. The effect of alumina addition from 1 to 5 wt.% on the properties of plasma sprayed YSZ films was investigated. Plasma sprayed zirconium oxide films have been characterized using scanning electron microscope (SEM) and X-ray diffractometer (XRD) for study of microstructure and phase analysis. The phase content and crystallite size of the films have been evaluated. The dependence of deposit characteristics on the concentration of additive was investigated and revealed that proper amount of alumina addition can improve the properties of plasma sprayed YSZ films. It was demonstrated how the started powder composition affects the density of the obtained films. (c) 2005 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2181 / 2184
页数:4
相关论文
共 11 条
[1]  
AMBRAZEVICIUS A, 1983, HEAT TRANSFER QUENCH, P174
[2]   Plasma spray: Study of the coating generation [J].
Fauchais, P ;
Vardelle, M ;
Vardelle, A ;
Bianchi, L .
CERAMICS INTERNATIONAL, 1996, 22 (04) :295-303
[3]   Effect of alumina additions upon electrical properties of 8 mol.% yttria-stabilised zirconia [J].
Feighery, AJ ;
Irvine, JTS .
SOLID STATE IONICS, 1999, 121 (1-4) :209-216
[4]   Influence of particle in-flight characteristics on the microstructure of atmospheric plasma sprayed yttria stabilized ZrO2 [J].
Friis, M ;
Persson, C ;
Wigren, J .
SURFACE & COATINGS TECHNOLOGY, 2001, 141 (2-3) :115-127
[5]   Influence of alumina dopant on the properties of yttria-stabilized zirconia for SOFC applications [J].
Hassan, AAE ;
Menzler, NH ;
Blass, G ;
Ali, ME ;
Buchkremer, HP ;
Stöver, D .
JOURNAL OF MATERIALS SCIENCE, 2002, 37 (16) :3467-3475
[6]   Study on the properties of Al2O3-doped (ZrO2)0.92(Y2O3)0.08 electrolyte [J].
Ji, Y ;
Liu, J ;
Lü, Z ;
Zhao, X ;
He, TM ;
Su, WH .
SOLID STATE IONICS, 1999, 126 (3-4) :277-283
[7]   YSZ layers by pulsed-MOCVD on solid oxide fuel cell electrodes [J].
Krumdieck, SP ;
Sbaizero, O ;
Bullert, A ;
Raj, R .
SURFACE & COATINGS TECHNOLOGY, 2003, 167 (2-3) :226-233
[9]   The influence of alumina on the microstructure and grain boundary conductivity of yttria-doped zirconia [J].
Rizea, A ;
Chirlesan, D ;
Petot, C ;
Petot-Ervas, G .
SOLID STATE IONICS, 2002, 146 (3-4) :341-353
[10]   Deposition and characterization of YSZ thin films by aerosol-assisted CVD [J].
Wang, HB ;
Xia, CR ;
Meng, GY ;
Peng, DK .
MATERIALS LETTERS, 2000, 44 (01) :23-28