Growth and Annealing Influence on Structural and Optical Properties of Nanostructured ZIO Thin Films

被引：0

作者：

Jain, Vipin Kumar ^{[1
]}

Kumar, Praveen ^{[2
]}

Jain, Praveen ^{[3
]}

Srivastava, S. ^{[1
]}

Vijay, Y. K. ^{[1
]}

机构：

[1] Univ Rajasthan, Thin Film & Membrane Sci Lab, Jaipur 302004, Rajasthan, India

[2] Natl Phys Lab, Surface Phys & Nanostruct Grp, New Delhi 110012, India

[3] Indian Inst Technol, Dept Phys, Roorkee 247667, Uttar Pradesh, India

来源：

SOLID STATE PHYSICS: PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010, PTS A AND B | 2011年 / 1349卷

关键词：

ZIO thin film; flash evaporation; annealing; AFM; Optical transmittance; TRANSPARENT; OXIDE;

D O I：

10.1063/1.3606018

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

Zinc-Indium-Oxide (ZIO) thin films were deposited on glass substrate with varying concentrations (ZnO: In2O3 - 100: 0, 90: 10, 70: 30 and 50: 50 wt%) at room temperature by flash evaporation technique. These deposited ZIO film were annealed at 450 degrees C in vacuum. These films were characterized to study the effect of annealing on the structural and optical properties. Atomic force microscopy (AFM) images manifest the surface morphology of these ZIO thin films. The apparent growth of surface features revealed the formation of nanostructured ZIO thin films. The optical transmittance found to be decreased however blue shift has been observed after annealing.

引用

页码：635 / +

页数：2

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