Lithography technology and trends for More than Moore devices Advanced Packaging & MEMS devices

被引:2
作者
Pizzagalli, Amandine [1 ]
机构
[1] Yole Dev, 75 Cours Emile Zola, F-69100 Villeurbanne, France
来源
34TH EUROPEAN MASK AND LITHOGRAPHY CONFERENCE | 2018年 / 10775卷
关键词
Lithography; resolution; RDL; wafer warpage; Depth of Focus (DOF); Advanced Packaging; MEMS; More than Moore;
D O I
10.1117/12.2326784
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
Lithography requirements for Advanced Packaging & MEMS are very different compared to mainstream semiconductor industries' needs. Even if the market entry barrier is much lower in the "More than Moore" market, customer adoptions needs are higher in the packaging area with respect to resolution, overlay, sidewall angle, and depth of focus (DOF), wafer handling for wafer bow and backside alignment. Key technical trends, requirements and challenges regarding the lithography technologies will be addressed in this paper. In addition, more insights on the current and emerging lithography methods for More than Moore devices will be included, as well as market forecast, competitive landscape of the major equipment suppliers addressing these fields.
引用
收藏
页数:3
相关论文
共 2 条
[1]  
Yole Developpement, 2017, LAS MAN SEM
[2]  
Yole Developpement, 2015, LITH ADV PACK MEMS L