Analysis of contact resistance in single-walled carbon nanotube channel and graphene electrodes in a thin film transistor

被引:10
作者
Baek, Jinwook [1 ]
Novak, Travis G. [1 ]
Kim, Houngkyung [1 ]
Lee, Jinsup [1 ]
Jang, Byoungwook [1 ]
Lee, Junseok [1 ]
Jeon, Seokwoo [1 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Mat Sci & Engn, 335 Gwahangno, Daejeon 305701, South Korea
来源
NANO CONVERGENCE | 2017年 / 4卷
基金
新加坡国家研究基金会;
关键词
D O I
10.1186/s40580-017-0130-1
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
In this work, we present the experimental investigation on the contact resistance of graphene/single-walled carbon nanotube (SWCNT) junction using transfer length method with the simple equivalent circuit model. We find that p-n like junctions are formed in graphene/SWCNT transistors, and the contact resistance in the junction is observed to be similar to 494 and similar to 617 k ohm in case of metallic SWCNT (m-SWCNT) and semiconducting SWCNT (s-SWCNT), respectively. In addition, the contact resistance increases from 617 to 2316 k ohm as V-g increases from - 30 to - 10 V. Through our study, high carrier density induced from doping in both graphene and SWCNT leads to low contact resistance. This development of contact engineering, namely modulation of carrier density in the junction and contact length (L-con) scaling shows the potential for all-carbon based electronics.
引用
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页数:6
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