Structural and optical characterization of size controlled silicon nanocrystals in SiO2/SiOxNy multilayers

被引：16

作者：

Lopez-Vidrier, J. ^{[1
]}

Hernandez, S. ^{[1
]}

Hartel, A. M. ^{[2
]}

Hiller, D. ^{[2
]}

Gutsch, S. ^{[2
]}

Loeper, P. ^{[2
,3
]}

Lopez-Conesa, L. ^{[1
]}

Estrade, S. ^{[1
]}

Peiro, F. ^{[1
]}

Zacharias, M. ^{[2
]}

Garrido, B. ^{[1
]}

机构：

[1] Univ Barcelona, Dept Elect, MIND, Marti i Franques 1, E-08028 Barcelona, Spain

[2] Univ Freiburg, Fac Engn, IMTEK, D-79110 Freiburg, Germany

[3] Fraunhofer Inst Solar Energy Syst, ISE, D-79110 Freiburg, Germany

来源：

EUROPEAN MATERIALS RESEARCH SOCIETY CONFERENCE SYMPOSIUM: ADVANCED INORGANIC MATERIALS AND CONCEPTS FOR PHOTOVOLTAICS | 2011年 / 10卷

关键词：

Silicon Nanocrystals; Oxynitride; EFTEM; Raman Scattering; Photoluminescence; QUANTUM CONFINEMENT;

D O I：

10.1016/j.egypro.2011.10.150

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

We offer a complete structural and optical study of samples containing silicon nanocrystals (Si-NCs) embedded in SiO2/SiON multilayers, varying the oxynitride layer thickness from 2.5 to 7 nm. Using energy-filtered transmission electron microscopy we have determined the size distribution of the precipitated Si-nanoaggregates. Raman scattering measurements were used to investigate the Si-NC size and crystalline quality. By combining both techniques, the nanoaggregate crystalline degree has been evaluated, with values around 50% for all the samples. Photoluminescence spectroscopy has shown a blueshift of the emission at smaller NC sizes, presenting the sample with Si-NCs of 3.9 nm the best emission properties. (C) 2011 Published by Elsevier Ltd. Selection and/or peer-review under responsibility of the Organizers of European Materials Research Society (EMRS) Conference: Symposium on Advanced Inorganic Materials and Concepts for Photovoltaics.

引用

页数：6

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