Total dose radiation effects of Au/PbZr0.52Ti0.48O3/YBa2Cu3O7-δ capacitors

被引：11

作者：

Gao, JX ^{[1
]}

Zheng, LR

Duo, XZ

Huang, JP

Yang, LX

Lin, CL

Yan, RL

机构：

[1] Chinese Acad Sci, Shanghai Inst Met, State Key Lab Funct Mat Informat, Shanghai 200050, Peoples R China

[2] Chinese Acad Sci, Xinjiang Inst Phys, Urmuqi, Peoples R China

来源：

THIN SOLID FILMS | 1999年 / 340卷 / 1-2期

关键词：

irradiation; retained polarization; dielectric constant; coercive field;

D O I：

10.1016/S0040-6090(98)01368-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

PbZr0.52Ti0.48O3/YBa2Cu3O7-delta (PZT/YBCO) thin films have been fabricated on Y2O3 stabilized zirconate (YSZ) substrates by a pulsed excimer laser deposition (PLD) method. In order to investigate total dose radiation effects on the Au/PZT/YBCO ferroelectric capacitor, the capacitance-voltage (C-V) curves and the retained polarization property of the capacitor have been measured before and after gamma-ray irradiation. The results showed that, with an increased total dose, the retained polarization and the dielectric constant decreased, but the coercive field drifted towards positive voltage direction. This is caused by charges trapped by defects in the PZT capacitor during irradiation. (C) 1999 Elsevier Science S.A. All rights reserved.

引用

页码：132 / 136

页数：5

共 24 条

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