Low-frequency noise in thick-film structures caused by traps in glass barriers

被引：0

作者：

Mrak, I

Jevtic, M

Stanimirovic, Z

机构：

来源：

1997 21ST INTERNATIONAL CONFERENCE ON MICROELECTRONICS - PROCEEDINGS, VOLS 1 AND 2 | 1997年

关键词：

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper a model of low-frequency noise in thick-film structures based on the close relationship of the noise and conduction mechanisms is presented. The interpretation of the observed experimental and calculated dependencies is given.

引用

页码：413 / 416

页数：4