Investigation of the local structure of LiPON thin films to better understand the role of nitrogen on their performance

被引:146
作者
Fleutot, B. [1 ,2 ]
Pecquenard, B. [1 ]
Martinez, H. [3 ]
Letellier, M. [4 ]
Levasseur, A. [1 ]
机构
[1] Univ Bordeaux, CNRS, ICMCB Site ENSCBP, F-33608 Pessac, France
[2] STMicroelectronics, Adv Technol R&D, IMS ASD & IPAD Div, F-37071 Tours 2, France
[3] Univ Pau & Pays Adour, Lab IPREM, UMR 5254, F-64053 Pau 9, France
[4] Univ Orleans, CNRS, CRMD, UMR 6619, F-45071 Orleans 2, France
关键词
Thin film; LiPON; XPS; Nitridation; Lithium microbatteries; Solid electrolyte; PHOSPHORUS OXYNITRIDE GLASSES; IONIC-CONDUCTIVITY; PHOSPHATE-GLASSES; LITHIUM; ELECTROLYTE; BATTERIES; PRESSURE; POWER; XPS;
D O I
10.1016/j.ssi.2011.01.006
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Amorphous thin solid films of lithium phosphorus oxynitride (LiPON) were prepared by radio-frequency sputtering from a Li(3)PO(4) target by varying nitrogen flow rate. The aim of this study is to establish the correlations between deposition conditions, composition, local structure and the electrical properties of the electrolyte (ionic conductivity and activation energy). As expected, ionic conductivity of LiPON thin films increases with nitrogen flow rate reaching a maximum of 3.10(-6) S cm(-1) while the activation energy reaches a minimum of 0.57 eV. The use of three complementary techniques, X-ray photoelectron spectroscopy, Raman spectroscopy and Nuclear Magnetic Resonance has allowed a thorough investigation of the local structure of the LiPON thin films. The formation of phosphorus-nitrogen bonds in place of phosphorus-oxygen bonds involves two kinds of nitrogen atoms (N1: a nitrogen atom linked to two phosphorus atoms (-N=), and N2: a nitrogen atom linked to three phosphorus atoms (-N<). The substitution of oxygen by nitrogen induces a decrease of the bridging oxygen/non-bridging oxygen ratio. This modification of the local structure favours lithium-ion mobility at the origin of the conductivity improvement. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:29 / 36
页数:8
相关论文
共 24 条
  • [1] Abragam A., 1961, AM J PHYS, V29, P860, DOI DOI 10.1119/1.1937646
  • [2] Thin-film lithium and lithium-ion batteries
    Bates, JB
    Dudney, NJ
    Neudecker, B
    Ueda, A
    Evans, CD
    [J]. SOLID STATE IONICS, 2000, 135 (1-4) : 33 - 45
  • [3] ELECTRICAL-PROPERTIES OF AMORPHOUS LITHIUM ELECTROLYTE THIN-FILMS
    BATES, JB
    DUDNEY, NJ
    GRUZALSKI, GR
    ZUHR, RA
    CHOUDHURY, A
    LUCK, CF
    ROBERTSON, JD
    [J]. SOLID STATE IONICS, 1992, 53 : 647 - 654
  • [4] FABRICATION AND CHARACTERIZATION OF AMORPHOUS LITHIUM ELECTROLYTE THIN-FILMS AND RECHARGEABLE THIN-FILM BATTERIES
    BATES, JB
    DUDNEY, NJ
    GRUZALSKI, GR
    ZUHR, RA
    CHOUDHURY, A
    LUCK, CF
    ROBERTSON, JD
    [J]. JOURNAL OF POWER SOURCES, 1993, 43 (1-3) : 103 - 110
  • [5] Change of the Oxidation State of Phosphorus in sputtered Li3±xPO4±y and Li3±xPO4±yNz Films
    Birke, P.
    Weppner, W.
    [J]. IONICS, 1996, 2 (01) : 75 - 79
  • [6] OXYGEN BONDING IN NITRIDED SODIUM-METAPHOSPHATE AND LITHIUM-METAPHOSPHATE GLASSES
    BROW, RK
    REIDMEYER, MR
    DAY, DE
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1988, 99 (01) : 178 - 189
  • [7] COMPOSITIONALLY DEPENDENT SI 2P BINDING-ENERGY SHIFTS IN SILICON OXYNITRIDE THIN-FILMS
    BROW, RK
    PANTANO, CG
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1986, 69 (04) : 314 - 316
  • [8] XPS MEASUREMENTS AND STRUCTURAL ASPECTS OF SILICATE AND PHOSPHATE-GLASSES
    BRUCKNER, R
    CHUN, HU
    GORETZKI, H
    SAMMET, M
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 1980, 42 (1-3) : 49 - 60
  • [9] STRUCTURE OF PHOSPHORUS OXYNITRIDE GLASSES
    BUNKER, BC
    TALLANT, DR
    BALFE, CA
    KIRKPATRICK, RJ
    TURNER, GL
    REIDMEYER, MR
    [J]. JOURNAL OF THE AMERICAN CERAMIC SOCIETY, 1987, 70 (09) : 675 - 681
  • [10] Radio-frequency magnetron sputtering power effect on the ionic conductivities of upon films
    Choi, CH
    Cho, WI
    Cho, BW
    Kim, HS
    Yoon, YS
    Tak, YS
    [J]. ELECTROCHEMICAL AND SOLID STATE LETTERS, 2002, 5 (01) : A14 - A17