Fourier Ptychography: Effectiveness of Image Classification

被引:2
作者
Zhang, Hongbo [1 ]
Wang, Lin [2 ]
Zhou, WenJing [3 ]
Hu, ZhiJuan [4 ]
Tsang, Peter W. M. [5 ]
Poon, Ting-Chung [6 ]
机构
[1] Virginia Mil Inst, Dept Comp & Informat Sci, Lexington, VA 24450 USA
[2] Nanjing Univ Sci & Technol, Sch Elect & Opt Engn, Nanjing, Jiangsu, Peoples R China
[3] Shanghai Univ, Dept Precis Mech Engn, Shanghai, Peoples R China
[4] Shanghai Normal Univ, Math & Sci Coll, Shanghai, Peoples R China
[5] City Univ Hongkong, Dept Eleectron Engn, Kowloon, 83 Tat Chee Ave, Hong Kong, Peoples R China
[6] Virginia Tech, Bradley Dept Elect & Comp Engn, Blacksburg, VA 24061 USA
来源
SEVENTH INTERNATIONAL CONFERENCE ON OPTICAL AND PHOTONIC ENGINEERING (ICOPEN 2019) | 2019年 / 11205卷
关键词
Fourier Ptychography; Image Classification; INTENSITY; TRANSPORT;
D O I
10.1117/12.2548097
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
In this research, we systematically investigated the image classification accuracy of Fourier Ptychography Microscopy (FPM). Multiple linear regression of image classification accuracy (dependent variable), PSNR and SSIM (independent variables) was performed. Notebly, results show that PSNR, SSIM, and image classification accuracy has a linear relationship. It is therefore feasible to predict the image classification accuracy only based on PSNR and SSIM. It is also found that image classification accuracy of the FPM is not universally significantly differed from the lower resolution image under the higher numerical aperture (NA) condition. The difference is yet much more pronounced under the lower NA condition.
引用
收藏
页数:8
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