Defect imaging by micromachined ultrasonic air transducers

被引:0
作者
Hansen, S [1 ]
Irani, N [1 ]
Degertekin, FL [1 ]
Ladabaum, I [1 ]
Khuri-Yakub, BT [1 ]
机构
[1] Stanford Univ, Edward L Ginzton Lab, Stanford, CA 94305 USA
来源
1998 IEEE ULTRASONICS SYMPOSIUM - PROCEEDINGS, VOLS 1 AND 2 | 1998年
关键词
D O I
暂无
中图分类号
O42 [声学];
学科分类号
070206 ; 082403 ;
摘要
Capacitive micromachined ultrasonic transducers (cMUTs) are shown to have over 100 dB dynamic range in air. This enables fast imaging of internal defects of solid structures with high signal-to-noise ratio. The high dynamic range is the result of a resonant structure with a fractional bandwidth limited to about 10%. Better temporal resolution is required to differentiate the defects in the depth dimension, which demands higher bandwidth devices. In this paper we present an optimized pulse-echo electronics system for cMUTs in air, simulations suggest that dynamic ranges in excess of 100 dB are attainable in pulse-echo operation using commercially available discrete components. Transmission experiments through aluminum and composite plates verify more than 100 dB dynamic range and demonstrate the ability of cMUTs to image defects in air at 2.3 MHz. We also present a variation on cMUT design which improves the useful bandwidth of the device, permitting greater depth resolution in pulse-echo imaging.
引用
收藏
页码:1003 / 1006
页数:4
相关论文
共 4 条
[1]  
GRANDIA WA, 1995, NDE APPL AIR COUPLED, P697
[2]   A surface micromachined electrostatic ultrasonic air transducer [J].
Haller, MI ;
KhuriYakub, BT .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1996, 43 (01) :1-6
[3]   Surface micromachined capacitive ultrasonic transducers [J].
Ladabaum, I ;
Jin, XC ;
Soh, HT ;
Atalar, A ;
Khuri-Yakub, BT .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1998, 45 (03) :678-690
[4]   APPLICATIONS OF MICROMACHINED CAPACITANCE TRANSDUCERS IN AIR-COUPLED ULTRASONICS AND NONDESTRUCTIVE EVALUATION [J].
SCHINDEL, DW ;
HUTCHINS, DA .
IEEE TRANSACTIONS ON ULTRASONICS FERROELECTRICS AND FREQUENCY CONTROL, 1995, 42 (01) :51-58