Noise in thick film resistors

被引：1

作者：

Rao, YS ^{[1
]}

机构：

[1] Sai Spurthi Inst Technol, ECE Dept, Sathupally 507303, India

来源：

IETE TECHNICAL REVIEW | 2005年 / 22卷 / 04期

关键词：

D O I：

10.1080/02564602.2005.11657909

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Various types of noise that can arise in a thick film resistor and contribute to overall noise of a hybrid circuit, are briefly reviewed. The origin of these noises, the effect of process parameters on them and their frequency dependence are discussed in some detail. Techniques to evaluate these noises are also specified. Design and process guidelines to minimise these noises in a thick film resistor are suggested.

引用

页码：259 / 265

页数：7

共 50 条

[31] High-voltage pulse stressing of thick-film resistors and noise
Stanimirovic, I
Jevtic, MM
Stanimirovic, Z
MICROELECTRONICS RELIABILITY, 2003, 43 (06) : 905 - 911
[32] CURRENT NOISE OF RESIN TYPE AND CERMET TYPE THICK-FILM RESISTORS
FU, SL
SHIRAMATSU, T
WU, TS
ELECTROCOMPONENT SCIENCE AND TECHNOLOGY, 1980, 7 (1-3): : 63 - 67
[33] Study of correlation among differential nonlinearity, nonlinearity and noise of thick film resistors
Mach, PJ
Svasta, PM
INFORMACIJE MIDEM-JOURNAL OF MICROELECTRONICS ELECTRONIC COMPONENTS AND MATERIALS, 1998, 28 (03): : 149 - 153
[34] THE MEASURING OF 1-F NOISE OF THICK AND THIN-FILM RESISTORS
DEMOLDER, S
VANDENDRIESSCHE, M
VANCALSTER, A
JOURNAL OF PHYSICS E-SCIENTIFIC INSTRUMENTS, 1980, 13 (12): : 1323 - 1327
[35] 1/F NOISE IN RU-BASED THICK-FILM RESISTORS
CHEN, TM
SU, SF
SMITH, D
SOLID-STATE ELECTRONICS, 1982, 25 (08) : 821 - 827
[36] BEHAVIOR OF THICK FILM RESISTORS DEPOSITED ON THICK FILM DIELECTRIC LAYERS
HIMMEL, RP
PROCEEDINGS ELECTRONIC COMPONENTS CONFERENCE, 1970, : 531 - &
[37] GEOMETRY DEPENDENCE OF THICK FILM RESISTORS
JEFFERSON, CF
PROCEEDINGS ELECTRONIC COMPONENTS CONFERENCE, 1970, : 209 - +
[38] HETEROGENEOUS THICK-FILM RESISTORS
CHAIKOVSKII, IA
SOVIET MICROELECTRONICS, 1988, 17 (04): : 165 - 176
[39] CONDUCTION MECHANISMS IN THICK FILM RESISTORS
FULLER, GL
VEST, RW
AMERICAN CERAMIC SOCIETY BULLETIN, 1970, 49 (09): : 830 - &
[40] Low-frequency noise of thick-film resistors as quality and reliability indicator
Rocak, D
Belavic, D
Hrovat, M
Sikula, J
Koktavy, P
Pavelka, J
Sedlakova, V
MICROELECTRONICS RELIABILITY, 2001, 41 (04) : 531 - 542

← 1 2 3 4 5 →