Study on the fluid/structure interaction at different inlet pressures in molded packaging

被引:33
作者
Khor, C. Y. [1 ]
Abdullah, M. Z. [1 ]
Ani, F. Che [2 ]
机构
[1] Univ Sains Malaysia, Sch Mech Engn, Nibong Tebal 14300, Penang, Malaysia
[2] Ind Technol Pk, Celest M Sdn Bhd, Kulim, Kedah, Malaysia
关键词
Fluid structure interaction (FSI); Finite volume method (FVM); Finite element method (FEM); Molded package; ENCAPSULATION; UNDERFILL; WARPAGE; RELIABILITY;
D O I
10.1016/j.mee.2011.06.026
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
This paper presents the computational study of fluid/structure interaction (FSI) analysis in the molding process using the Mesh-based parallel Code Coupling Interface (MpCCI) method with finite volume coding (FLUENT 6.3) and finite element coding (ABAQUS 6.9). The FSI analysis is implemented on the molded package during the encapsulation process with different inlet pressures. Real-time flow visualization, deformation and stress of the silicon die during the encapsulation process are presented in this paper. A fluctuation phenomenon of the silicon die is found in the encapsulation process when the inlet pressure increases. The maximum deformation during the process is determined at different locations on the silicon die, calculated during the final stage of the filling process. The deformation and stress of the die is exponentially increased with increasing inlet pressure. The maximum stress on the solder bump is concentrated near to the inlet gate. Thus, the present FSI analysis approach is expected to be a guideline or reference and provides better understanding of the encapsulation process for package design in the microelectronic industry. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:3182 / 3194
页数:13
相关论文
共 27 条
[1]  
[Anonymous], MODELLING MULTIPHASE
[2]  
Bae DH, 2003, J IND ENG CHEM, V9, P188
[3]  
Braun T, 2006, IEEE/CPMT INT EL MFG, P27
[4]   Three-dimensional modeling of mold filling in microelectronics encapsulation process [J].
Chang, RY ;
Yang, WH ;
Hwang, SJ ;
Su, F .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2004, 27 (01) :200-209
[5]   Comparing the impacts of the capillary and the molded underfill process on the reliability of the flip-chip BGA [J].
Chen, K. A. .
IEEE TRANSACTIONS ON COMPONENTS AND PACKAGING TECHNOLOGIES, 2008, 31 (03) :586-591
[6]   Effects of molding pressure on the warpage and the viscoelasticities of HVQFN packages [J].
Gui, D. Y. ;
Ernst, L. J. ;
Jansen, K. M. B. ;
Yang, D. G. ;
Goumans, L. ;
Bressers, H. J. L. ;
Janssen, J. H. J. .
JOURNAL OF APPLIED POLYMER SCIENCE, 2008, 109 (03) :2016-2022
[7]  
Jung BY, 2009, 2009 IEEE 59TH ELECTRONIC COMPONENTS AND TECHNOLOGY CONFERENCE, VOLS 1-4, P301, DOI 10.1109/ECTC.2009.5074031
[8]   Controlling warpage of molded package for inkjet manufacturing [J].
Kaija, Kimmo ;
Pekkanen, Ville ;
Maentysalo, Matti ;
Mansikkamdki, Pauliina .
MICROELECTRONIC ENGINEERING, 2008, 85 (03) :518-526
[9]   Molded flip chip BGA characterization [J].
Kao, N ;
Lai, JY ;
Wang, MZ ;
Wang, YP ;
Hsiao, CS .
6TH ELECTRONICS PACKAGING TECHNOLOGY CONFERENCE, PROCEEDINGS (EPTC 2004), 2004, :109-114
[10]   Numerical analysis on the effects of different inlet gates and gap heights in TQFP encapsulation process [J].
Khor, C. Y. ;
Abdullah, M. Z. ;
Abdullah, M. K. ;
Mujeebu, M. A. ;
Ramdan, D. ;
Majid, M. F. M. A. ;
Ariff, Z. M. ;
Rahman, M. R. Abdul .
INTERNATIONAL JOURNAL OF HEAT AND MASS TRANSFER, 2011, 54 (9-10) :1861-1870