Automatic Image Segmentation for Material Microstructure Characterization by Optical Microscopy

被引：0

作者：

Ramou, Naim ^{[1
]}

Chetih, Nabil ^{[1
]}

Boutiche, Yamina ^{[1
]}

Abdelkader, Rabah ^{[1
]}

机构：

[1] Res Ctr Ind Technol CRTI, POB 64, Algiers 16014, Algeria

来源：

INFORMATICA-AN INTERNATIONAL JOURNAL OF COMPUTING AND INFORMATICS | 2020年 / 44卷 / 03期

关键词：

level set; microstructure characterization; image segmentation;

D O I：

10.31449/inf.v44i3.3034

中图分类号：

TP31 [计算机软件];

学科分类号：

081202 ; 0835 ;

摘要：

This work shows the microstructure characterization utility for the analysis of material properties. To achieve this purpose, digital image segmentation is used on microscopic images of materials to extract the number of phases and their proportion present in the material to obtain a quantitative description of material properties and to better control product quality. In this way, we present here an automated method for segmenting the phases present in microscopic scanning images of metallographic samples using a multiphase level set with Mumford Shah formulation. Experience shows that the proposed model successfully detects phase regions for a variety of real micrographic images

引用

页码：367 / 372

页数：6

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