Interface phenomena between CdTe and ZnTe:Cu back contact

被引:34
作者
Bosio, A. [1 ]
Ciprian, R. [2 ]
Lamperti, A. [3 ]
Rago, I [2 ]
Ressel, B. [4 ]
Rosa, G. [1 ]
Stupar, M. [4 ]
Weschke, E. [5 ]
机构
[1] Univ Parma, Parco Area Sci 7-A, I-43124 Parma, Italy
[2] Elettra Sincrotrone Trieste, Ss 14 Km 163-5, I-34149 Trieste, Italy
[3] CNR, IMM, Agrate Unit, Via C Olivetti 2, I-20864 Agrate Brianza, MB, Italy
[4] Univ Nova Gorica, Vipavska Cesta 11c, Ajdovscina 5270, Slovenia
[5] Helmholtz Zentrum Berlin Mat & Energie, Albert Einstein Str 15, D-12489 Berlin, Germany
关键词
CdTe; ZnTe:Cu back-contact; XANES; ToF-SIMS; X-RAY-ABSORPTION; CU THIN-FILMS; SOLAR-CELLS; DOPED ZNTE; STABILITY; PHOTOELECTRON; TELLURIDE; LAYER; CUXTE; XPS;
D O I
10.1016/j.solener.2018.10.035
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Thin film technology has reached a maturity to achieve conversion efficiencies of the order of 22%. Among thin films, CdTe-based photovoltaic modules represent 80% of the total production. Nonetheless, some issues concerning back-contact are still open. In industrial process a chemical etching is required in order to make the CdTe film surface rich in Te. The Te-excess is fundamental in order to form a stable telluride compound with copper and to obtain an ohmic, low-resistance back-contact. Moreover, the Te-excess hinders the fast diffusion of copper in CdTe and its achievement of the junction region, preventing the destruction of the device. In this paper we study a ZnTe:Cu buffer layer deposited onto a CdTe film, characterized by a naturally Te-rich surface obtained with a particular chlorine heat treatment without any chemical etching. Copper diffusion and the CdTe/ZnTe:Cu interface were studied by x-ray photoemission spectroscopy (SIPS) and time-of-flight secondary ion mass spectrometry (ToF- SIMS) to deeply analyze the intermixing phenomena and copper behavior inside polycrystalline CdTe film.
引用
收藏
页码:186 / 193
页数:8
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