A low-temperature supercritical nitridation technology for enhancing the performance of AlGaN/GaN HEMTs

被引:3
|
作者
Zhang, Hong [1 ]
Chen, Guanjun [1 ]
Zhang, Jincheng [1 ]
Zheng, Xuefeng [1 ]
Zhou, Hong [1 ]
Zhao, Shenglei [1 ]
Hao, Yue [1 ]
机构
[1] Xidian Univ, Sch Microelect, State Key Discipline Lab Wide Band Gap Semicond T, 2 South TaiBai Rd, Xian 710071, Peoples R China
关键词
Supercritical fluid; Nitridation; AlGaN/GaN HEMTs; Interface trap states; GALLIUM; GAS;
D O I
10.1016/j.supflu.2019.104746
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
A non-destructive low-temperature supercritical nitridation (LTSCN) is proved to boost the performance of AlGaN/GaN HEMTs. The samples were treated at 120 degrees in a supercritical CO2 fluid mixed with NH3 under 20.7 MPa for one hour. After the LTSCN, the gate leakage current decreases by 69.6 % for an increase of the Schottky barrier height and the subthreshold swing is reduced by 19.9 %. Furthermore, the on-resistance is reduced by 20.4 % due to an enhancement of the mobility. The slow trap state density near AlGaN/GaN interface decreases from (5.12 x 10(13) to 7.07 x 10(13)) cm(-2).ev(-1) to (1.80 x 10(13) to 2.36 x 10(13)) cm(-2).eV(-1) with a decrease in activation energy from (0.492 to 0.500) eV to (0.467 to 0.496) eV after the LTSCN. A modified model of the LTSCN is presented to expound the change of the slow traps and the Coulomb scattering effect of electrons capture in the changed slow traps is adopted to explain the mobility improvement. (C) 2019 Elsevier B.V. All rights reserved.
引用
收藏
页数:6
相关论文
共 50 条
  • [21] Optimization of π - Gate AlGaN/AlN/GaN HEMTs for Low Noise and High Gain Applications
    Sehra, Khushwant
    Kumari, Vandana
    Gupta, Mridula
    Mishra, Meena
    Rawal, D. S.
    Saxena, Manoj
    SILICON, 2022, 14 (02) : 393 - 404
  • [22] Improved Microwave Noise Performance in 0.15μm AlGaN/AlN/GaN HEMTs on Silicon
    Ng, G. I.
    Arulkumaran, S.
    Ranjan, K.
    Vicknesh, S.
    2014 44TH EUROPEAN MICROWAVE CONFERENCE (EUMC), 2014, : 1384 - 1387
  • [23] Improved Microwave Noise Performance in 0.15μm AlGaN/AlN/GaN HEMTs on Silicon
    Ng, G. I.
    Arulkumaran, S.
    Ranjan, K.
    Vicknesh, S.
    2014 9TH EUROPEAN MICROWAVE INTEGRATED CIRCUIT CONFERENCE (EUMIC), 2014, : 440 - 443
  • [24] On The Role of Stress Engineering of Surface Passivation in Determining the Device Performance of AlGaN/GaN HEMTs
    Mir, Mehak A.
    Thakare, A.
    Munshi, M. A.
    Avinash, V.
    Wani, S.
    Khan, Z.
    Chaudhuri, R.
    Karthik, S.
    Malik, R.
    Joshi, V.
    Shrivastava, M.
    2024 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM, IRPS 2024, 2024,
  • [25] Enhancing the Performance of E-Mode AlGaN/GaN HEMTs With Recessed Gates Through Low-Damage Neutral Beam Etching and Post-Metallization Annealing
    Chen, Yi-Ho
    Ohori, Daisuke
    Aslam, Muhammad
    Lee, Yao-Jen
    Li, Yiming
    Samukawa, Seiji
    IEEE OPEN JOURNAL OF NANOTECHNOLOGY, 2023, 4 : 150 - 155
  • [26] Schottky forward current transport mechanisms in AlGaN/GaN HEMTs over a wide temperature range
    武玫
    郑大勇
    王媛
    陈伟伟
    张凯
    马晓华
    张进成
    郝跃
    ChinesePhysicsB, 2014, 23 (09) : 413 - 417
  • [27] Simulation of temperature and electric field-dependent barrier traps effects in AlGaN/GaN HEMTs
    Wang, Ashu
    Martin-Horcajo, Sara
    Tadjer, Marko J.
    Calle, Fernando
    SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2015, 30 (01)
  • [28] Temperature-Dependent ESD Breakdown in AlGaN/GaN HEMTs With Carbon-Doped Buffer
    Munshi, Mohammad Ateeb
    Mir, Mehak Ashraf
    Joshi, Vipin
    Chaudhuri, Rajarshi Roy
    Malik, Rasik
    Shrivastava, Mayank
    IEEE TRANSACTIONS ON ELECTRON DEVICES, 2024, 71 (11) : 6588 - 6595
  • [29] Schottky forward current transport mechanisms in AlGaN/GaN HEMTs over a wide temperature range
    Wu Mei
    Zheng Da-Yong
    Wang Yuan
    Chen Wei-Wei
    Zhang Kai
    Ma Xiao-Hua
    Zhang Jin-Cheng
    Hao Yue
    CHINESE PHYSICS B, 2014, 23 (09)
  • [30] Ti/Al/Ti/TiW Au-free low temperature ohmic contacts for un-doped AlGaN/GaN HEMTs
    Li, Qixin
    Zhou, Quanbin
    Gao, Sheng
    Liu, Xiaoyi
    Wang, Hong
    SOLID-STATE ELECTRONICS, 2018, 147 : 1 - 5