共 50 条
- [1] High Performance AlGaN/GaN HEMTs by Supercritical Fluid2019 IEEE INTERNATIONAL CONFERENCE ON ELECTRON DEVICES AND SOLID-STATE CIRCUITS (EDSSC), 2019,Huang, Zhangwei论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Shenzhen Grad Sch, Shenzhen Key Lab Adv Electron Device & Integrat E, Shenzhen, Peoples R China Peking Univ, Shenzhen Grad Sch, Shenzhen Key Lab Adv Electron Device & Integrat E, Shenzhen, Peoples R ChinaLiu, Meihua论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Shenzhen Grad Sch, Shenzhen Key Lab Adv Electron Device & Integrat E, Shenzhen, Peoples R China Peking Univ, Shenzhen Grad Sch, Shenzhen Key Lab Adv Electron Device & Integrat E, Shenzhen, Peoples R ChinaLin, Xinnan论文数: 0 引用数: 0 h-index: 0机构: Peking Univ, Shenzhen Grad Sch, Shenzhen Key Lab Adv Electron Device & Integrat E, Shenzhen, Peoples R China Peking Univ, Shenzhen Grad Sch, Shenzhen Key Lab Adv Electron Device & Integrat E, Shenzhen, Peoples R China
- [2] Performance and Reliability Optimization of Supercritical-Nitridation-Treated AlGaN/GaN High-Electron-Mobility TransistorsIEEE TRANSACTIONS ON ELECTRON DEVICES, 2021, 68 (09) : 4317 - 4321Wu, Pei-Yu论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanChang, Ting-Chang论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Ctr Crystal Res, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanChen, Ming-Chen论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanZheng, Hao-Xuan论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanLin, Yu-Shan论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanTsai, Xin-Ying论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanChang, Kuo-Jen论文数: 0 引用数: 0 h-index: 0机构: Natl Chung Shan Inst Sci & Technol, Mat & Electroopt Res Div, Taoyuan 32546, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanKuo, Wei-Cheng论文数: 0 引用数: 0 h-index: 0机构: Natl Chung Shan Inst Sci & Technol, Mat & Electroopt Res Div, Taoyuan 32546, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanLin, Chao-Wei论文数: 0 引用数: 0 h-index: 0机构: Natl Chung Shan Inst Sci & Technol, Mat & Electroopt Res Div, Taoyuan 32546, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanLiu, Guan-Shian论文数: 0 引用数: 0 h-index: 0机构: Natl Chung Shan Inst Sci & Technol, Mat & Electroopt Res Div, Taoyuan 32546, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, TaiwanTsai, Tsung-Ming论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan Natl Sun Yat Sen Univ, Dept Mat & Optoelect Sci, Kaohsiung 80424, Taiwan
- [3] Measurement of Junction Temperature in AlGaN/GaN HEMTs2017 IEEE 24TH INTERNATIONAL SYMPOSIUM ON THE PHYSICAL AND FAILURE ANALYSIS OF INTEGRATED CIRCUITS (IPFA), 2017,Gao Li论文数: 0 引用数: 0 h-index: 0机构: China Elect Standardizat Inst, AnDingMen East St 1, Beijing 100176, Peoples R China China Elect Standardizat Inst, AnDingMen East St 1, Beijing 100176, Peoples R ChinaGuo ChunSheng论文数: 0 引用数: 0 h-index: 0机构: Beijing Univ Technol, 100 Pingleyuan, Beijing 100124, Peoples R China China Elect Standardizat Inst, AnDingMen East St 1, Beijing 100176, Peoples R ChinaLi ShiWei论文数: 0 引用数: 0 h-index: 0机构: Beijing Univ Technol, 100 Pingleyuan, Beijing 100124, Peoples R China China Elect Standardizat Inst, AnDingMen East St 1, Beijing 100176, Peoples R China
- [4] Temperature-Dependent Electrical Characteristics and Low-Frequency Noise Analysis of AlGaN/GaN HEMTsIEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY, 2024, 12 : 698 - 702Chen, Qiang论文数: 0 引用数: 0 h-index: 0机构: South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R China South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R ChinaChen, Y. Q.论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res I, Sci & Technol Reliabil Phys & Applicat Elect Compo, Guangzhou 511370, Guangdong, Peoples R China South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R ChinaLiu, Chang论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res I, Sci & Technol Reliabil Phys & Applicat Elect Compo, Guangzhou 511370, Guangdong, Peoples R China South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R ChinaHe, Zhiyuan论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res I, Sci & Technol Reliabil Phys & Applicat Elect Compo, Guangzhou 511370, Guangdong, Peoples R China South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R ChinaChen, Yuan论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res I, Sci & Technol Reliabil Phys & Applicat Elect Compo, Guangzhou 511370, Guangdong, Peoples R China South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R ChinaGeng, K. W.论文数: 0 引用数: 0 h-index: 0机构: South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R China South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R ChinaHe, Y. J.论文数: 0 引用数: 0 h-index: 0机构: China Elect Prod Reliabil & Environm Testing Res I, Sci & Technol Reliabil Phys & Applicat Elect Compo, Guangzhou 511370, Guangdong, Peoples R China South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R ChinaChen, W. Y.论文数: 0 引用数: 0 h-index: 0机构: South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R China South China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R China
- [5] Improvement of the performance of ZnO TFTs by low-temperature supercritical fluid technology treatmentSURFACE & COATINGS TECHNOLOGY, 2009, 204 (6-7) : 1112 - 1115Chen, Min-Chen论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanChang, Ting-Chang论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Ctr Nanosci & Nanotechnol, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanHuang, Sheng-Yao论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanChang, Kuan-Chang论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mech & Electromech Engn, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanHuang, Hui-Chun论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat Sci & Engn, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanChen, Shih-Ching论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanLu, Jin论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanGan, Der-Shin论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat Sci & Engn, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanHo, New-Jin论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mat Sci & Engn, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanYoung, Tai-Fa论文数: 0 引用数: 0 h-index: 0机构: Natl Sun Yat Sen Univ, Dept Mech & Electromech Engn, Kaohsiung 804, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanJhang, Geng-Wei论文数: 0 引用数: 0 h-index: 0机构: Natl Chiao Tung Univ, Dept Display Inst, Hsinchu 300, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, TaiwanTai, Ya-Hsiang论文数: 0 引用数: 0 h-index: 0机构: Natl Chiao Tung Univ, Dept Display Inst, Hsinchu 300, Taiwan Natl Sun Yat Sen Univ, Dept Phys, Kaohsiung 804, Taiwan
- [6] Effects of high temperature on the electrical behavior of AlGaN/GaN HEMTsMICROWAVE AND OPTICAL TECHNOLOGY LETTERS, 2002, 34 (01) : 4 - 6Guhel, Y论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, FranceBoudart, B论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, FranceHoel, V论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, FranceWerquin, M论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, FranceGaquiere, C论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, FranceDe Jaeger, JC论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, FrancePoisson, MA论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, FranceDaumiller, I论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, FranceKohn, E论文数: 0 引用数: 0 h-index: 0机构: Univ Sci & Tech Lille Flandres Artois, CNRS, UMR 8520, IEMN, F-59652 Villeneuve Dascq, France
- [7] High performance AlGaN/GaN HEMTs with AlN/SiNx passivationJOURNAL OF SEMICONDUCTORS, 2015, 36 (07)Tan Xin论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaLu Yuanjie论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaGu Guodong论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaWang Li论文数: 0 引用数: 0 h-index: 0机构: China Natl Def Sci Technol Informat Ctr, Beijing 100040, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaDun Shaobo论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaSong Xubo论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaGuo Hongyu论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaYin Jiayun论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaCai Shujun论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R ChinaFeng Zhihong论文数: 0 引用数: 0 h-index: 0机构: Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China Hebei Semicond Res Inst, Natl Key Lab Applicat Specif Integrated Circuit A, Shijiazhuang 050051, Hebei, Peoples R China
- [8] High performance AlGaN/GaN HEMTs with AlN/SiNx passivationJournal of Semiconductors, 2015, (07) : 98 - 101谭鑫论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute吕元杰论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute顾国栋论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute王丽论文数: 0 引用数: 0 h-index: 0机构: China National Defense Sciences Technology Information Center National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute敦少博论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute宋旭波论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute郭红雨论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute尹甲运论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute蔡树军论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute冯志红论文数: 0 引用数: 0 h-index: 0机构: National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute National Key Laboratory of Application Specific Integrated Circuit (ASIC),Hebei Semiconductor Research Institute
- [9] The Channel Temperature Dependence of Drain Transient Response in AlGaN/GaN HEMTsPROCEEDINGS OF 2014 10TH INTERNATIONAL CONFERENCE ON RELIABILITY, MAINTAINABILITY AND SAFETY (ICRMS), VOLS I AND II, 2014, : 201 - 204Zhang, Yamin论文数: 0 引用数: 0 h-index: 0机构: Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R ChinaFeng, Shiwei论文数: 0 引用数: 0 h-index: 0机构: Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R ChinaZhu, Hui论文数: 0 引用数: 0 h-index: 0机构: Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R ChinaGong, Xueqin论文数: 0 引用数: 0 h-index: 0机构: Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R ChinaGuo, Chunsheng论文数: 0 引用数: 0 h-index: 0机构: Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China Beijing Univ Technol, Coll Elect Informat & Control Engn, Beijing, Peoples R China
- [10] Temperature and voltage effects on HTRB and HTGB stresses for AlGaN/GaN HEMTs2018 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM (IRPS), 2018,Chihani, Omar论文数: 0 引用数: 0 h-index: 0机构: Univ Bordeaux, CNRS, Bordeaux INP, IMS,UMR 5218, F-33400 Talence, France IRT St Exupery, 118 Route Narbonne, F-31432 Toulouse, France Univ Bordeaux, CNRS, Bordeaux INP, IMS,UMR 5218, F-33400 Talence, FranceTheolier, Loic论文数: 0 引用数: 0 h-index: 0机构: Univ Bordeaux, CNRS, Bordeaux INP, IMS,UMR 5218, F-33400 Talence, France Univ Bordeaux, CNRS, Bordeaux INP, IMS,UMR 5218, F-33400 Talence, FranceDeletage, Jean-Yves论文数: 0 引用数: 0 h-index: 0机构: Univ Bordeaux, CNRS, Bordeaux INP, IMS,UMR 5218, F-33400 Talence, France Univ Bordeaux, CNRS, Bordeaux INP, IMS,UMR 5218, F-33400 Talence, FranceWoirgard, Eric论文数: 0 引用数: 0 h-index: 0机构: Univ Bordeaux, CNRS, Bordeaux INP, IMS,UMR 5218, F-33400 Talence, France Univ Bordeaux, CNRS, Bordeaux INP, IMS,UMR 5218, F-33400 Talence, France论文数: 引用数: h-index:机构:论文数: 引用数: h-index:机构: