An integrated opto-mechanical sensor for in situ characterisation of MEMS: the implementing of a read out architecture

被引:6
作者
Gorecki, C [1 ]
Sabac, A [1 ]
Bey, P [1 ]
Gut, K [1 ]
Jacobelli, A [1 ]
Dean, T [1 ]
机构
[1] Univ Franche Comte, CNRS, UMR 6603, Lab Opt PM Duffieux, F-25030 Besancon, France
来源
MICROSYSTEMS ENGINEERING: METROLOGY AND INSPECTION III | 2003年 / 5145卷
关键词
microsensors; integrated optics; MEMS; Mach Zehnder interferometry;
D O I
10.1117/12.501463
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
While testing electrical properties in microsystems is a well-developed art, the testing of mechanical properties of MEMS devices is not. There is a great need for techniques that will permit the evaluation of MEMS devices, in all stages of manufacturing, with respect to material and micromechanical properties. In this contribution we propose a new approach, based on the integrated optical read-out using a Mach-Zehnder interferometer, monolithically integrated into the PZT actuated membrane.
引用
收藏
页码:189 / 195
页数:7
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