Fabrication and characterisation of TiO2 anti-reflection coatings with gradient index

被引:2
|
作者
Tian, Li [1 ]
Li, Ling [1 ]
Wu, Min [2 ]
机构
[1] Harbin Inst Technol, Sch Astronaut, Harbin 150001, Heilongjiang, Peoples R China
[2] Shanghai Solar Energy Res Ctr, Shanghai 200241, Peoples R China
来源
MICRO & NANO LETTERS | 2017年 / 12卷 / 11期
关键词
nanostructured materials; texture; antireflection coatings; gradient index optics; titanium compounds; sputter deposition; ellipsometry; refractive index; wide band gap semiconductors; semiconductor thin films; semiconductor growth; nanofabrication; nanotextured antireflection films; transmittance character; surface reflection loss; gradient-index titanium dioxide antireflection coatings; radiofrequency magnetron sputtering; oblique-angle deposition technique; low-iron glass substrates; optical characteristics; ellipsometric model; structural properties; size 50 nm to 400 nm; TiO2; CHEMICAL-VAPOR-DEPOSITION; SILICON SOLAR-CELLS; THIN-FILMS; SPECTROSCOPIC ELLIPSOMETRY; SPECTRA; PLASMA; RAMAN;
D O I
10.1049/mnl.2017.0408
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Nano-textured anti-reflection (AR) films are designed elaborately to improve the transmittance character and to reduce the surface reflection loss. This work reports the gradient-index titanium dioxide (TiO2) AR coatings (ARCs) with the thickness of 50-400 nm, which was deposited by radio-frequency magnetron sputtering-assisted with the oblique-angle deposition technique on the low-iron glass substrates. The technological parameters related with this deposition were discussed such as the base pressure and target-substrate distance, as well as the vapour incident angle. Then, optical characteristics of the graded-index coating were discussed. An ellipsometric model was built to account for the structural and optical differences. The optimal thickness of the TiO2 ARC was about 250 nm. It exhibited a higher transmittance at the visible light regions over a large wavelength range than that of the primitive glass substrate. The value of refractive index for the TiO2 ARC was 2.245 at the wavelength of 632.8 nm.
引用
收藏
页码:849 / 853
页数:5
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