A multi-layer electro-optic field probe

被引：4

作者：

Lee, Dong-Joon ^{[1
]}

Kwon, Jae-Yong ^{[1
]}

Ryu, Han-Young ^{[1
]}

Whitaker, John F. ^{[2
]}

机构：

[1] Korea Res Inst Stand & Sci, Div Phys Metrol, Taejon 305340, South Korea

[2] Univ Michigan, Dept Elect Engn & Comp Sci, Ctr Ultrafast Opt Sci, Ann Arbor, MI 48109 USA

来源：

OPTICS EXPRESS | 2010年 / 18卷 / 24期

关键词：

MICROWAVE;

D O I：

10.1364/OE.18.024735

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a novel design method and sensing scheme for an electro-optic field probe using multi-stratified layers of electro-optic wafers. A serial stack of cascaded layers is found to be capable of enhancing the performance of interferometric electro-optic light modulation that utilizes the slopes of interference fringe patterns and field-induced electro-optic phase retardations within wafers. The absolute sensitivity of the probe is also characterized with a micro-TEM cell that generates electric fields distributions with accurate, calculable strength for use in probe calibration. The sensitivity of a multi-layered probe-per unit electro-optic wafer volume - was enhanced by 6 dB compared to that of a single-layer one. (C) 2010 Optical Society of America

引用

页码：24735 / 24744

页数：10

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