Growth of three-dimensional SiC clusters on Si modelled by KMC

被引:19
作者
Schmidt, AA
Kharlamov, VS
Safonov, KL
Trushin, YV
Zhurkin, EE
Cimalla, V
Ambacher, O
Pezoldt, J
机构
[1] AF Ioffe Phys Tech Inst, St Petersburg 194021, Russia
[2] St Petersburg State Polytech Univ, St Petersburg 195251, Russia
[3] Tech Univ Ilmenau, Zentrum Mikro & Nanotechnol, FG Nanotechnol, D-98684 Ilmenau, Germany
关键词
D O I
10.1016/j.commatsci.2004.12.005
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The formation of silicon carbide nanoclusters on silicon substrates by MBE deposition of carbon provides a variety of applications, such as antidot structures, nanowire heterostructures, wave guides and arrays of tips for cold cathode emission. The SiC growth on Si is unusual for semiconductor systems with large lattice mismatch due to the formation of a Si1-xCx solid solution along with the formation of two-dimensional 3C-SiC, and a subsequent step transforming the two-dimensional (2D) clusters into three-dimensional (3D) clusters for overall stress minimization. At the same time there are strong experimental evidences that under some experimental conditions 2D clusters could exist even at relatively high coverages. To study the transition from the 2D to the 3D cluster during SiC nucleation and growth the kinetic Monte Carlo method was used. Silicon and carbon atoms are allowed to exchange between the fixed sites of the 3D lattice with the symmetry of the diamond lattice (to simulate the growth of the 3C-SiC polytype mainly observed in growth experiments). The fitting parameters were estimated by means of molecular dynamics simulation as well as by comparing the data obtained with the experimental TEM results. Formation of a three-dimensional clusters and pits in the surface is demonstrated. (c) 2004 Published by Elsevier B.V.
引用
收藏
页码:375 / 381
页数:7
相关论文
共 23 条
[1]  
Allen P., 1987, COMPUTER SIMULATION
[2]   NEW ALGORITHM FOR MONTE-CARLO SIMULATION OF ISING SPIN SYSTEMS [J].
BORTZ, AB ;
KALOS, MH ;
LEBOWITZ, JL .
JOURNAL OF COMPUTATIONAL PHYSICS, 1975, 17 (01) :10-18
[3]   BINDING AND DIFFUSION OF A SI ADATOM ON THE SI(100) SURFACE [J].
BROCKS, G ;
KELLY, PJ ;
CAR, R .
PHYSICAL REVIEW LETTERS, 1991, 66 (13) :1729-1732
[4]   Status of silicon carbide (SiC) as a wide-bandgap semiconductor for high-temperature applications: A review [J].
Casady, JB ;
Johnson, RW .
SOLID-STATE ELECTRONICS, 1996, 39 (10) :1409-1422
[5]   C adsorption and diffusion at the Si(001) surface: implications for SiC growth [J].
Cicero, G ;
Catellani, A .
APPLIED SURFACE SCIENCE, 2001, 184 (1-4) :113-117
[6]   Initial stages in the carbonization of (111)Si by solid-source molecular beam epitaxy [J].
Cimalla, V ;
Stauden, T ;
Ecke, G ;
Scharmann, F ;
Eichhorn, G ;
Pezoldt, J ;
Sloboshanin, S ;
Schaefer, JA .
APPLIED PHYSICS LETTERS, 1998, 73 (24) :3542-3544
[7]   Lateral alignment of SiC dots on Si [J].
Cimalla, V ;
Pezoldt, J ;
Stauden, T ;
Schmidt, AA ;
Zekentes, K ;
Ambacher, O .
E-MRS 2003 FALL MEETING, SYMPOSIA A AND C, PROCEEDINGS, 2004, 1 (02) :337-340
[8]   A molecular dynamics evidence for enhanced cluster beam epitaxy [J].
Hou, M .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1998, 135 (1-4) :501-506
[9]   Quantum dot self-assembly in growth of strained-layer thin films: A kinetic Monte Carlo study [J].
Khor, KE ;
Das Sarma, S .
PHYSICAL REVIEW B, 2000, 62 (24) :16657-16664
[10]   Competing roughening mechanisms in strained heteroepitaxy: A fast kinetic Monte Carlo study [J].
Lam, CH ;
Lee, CK ;
Sander, LM .
PHYSICAL REVIEW LETTERS, 2002, 89 (21) :216102-216102