A Twin Symbol Encoding Technique Based on Run-Length for Efficient Test Data Compression

被引：1

作者：

Park, Jaeseok ^{[1
]}

Kang, Sungho ^{[1
]}

机构：

[1] Yonsei Univ, Dept Elect Engn, Seoul 120749, South Korea

来源：

ETRI JOURNAL | 2011年 / 33卷 / 01期

关键词：

Test data compression; low-power dissipation; A-CHIP TEST; CODES;

D O I：

10.4218/etrij.11.0210.0154

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Recent test data compression techniques raise concerns regarding power dissipation and compression efficiency This letter proposes a new test data compression scheme, twin symbol encoding, that supports block division skills that can reduce hardware overhead Our experimental results show that the proposed technique achieves both a high compression ratio and low-power dissipation. Therefore, the proposed scheme is an attractive solution for efficient test data compression.

引用

页码：140 / 143

页数：4

共 10 条

[1]

Chandra A, 2001, IEEE VLSI TEST SYMP, P42, DOI 10.1109/VTS.2001.923416

[2] System-on-a-chip test-data compression and decompression architectures based on Golomb codes [J].

Chandra, A ;

Chakrabarty, K .

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2001, 20 (03) :355-368

[3] Variable-length input Huffman coding for system-on-a-chip test [J].

Gonciari, PT ;

Al-Hashimi, BM ;

Nicolici, N .

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (06) :783-796

[4] Scan vector compression/decompression using statistical coding [J].

Jas, A ;

Ghosh-Dastidar, J ;

Touba, NA .

17TH IEEE VLSI TEST SYMPOSIUM, PROCEEDINGS, 1999, :114-120

[5] An efficient test vector compression scheme using selective huffman coding [J].

Jas, A ;

Ghosh-Dastidar, J ;

Ng, ME ;

Touba, NA .

IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2003, 22 (06) :797-806

[6] Optimal selective Huffman coding for test-data compression [J].

Kavousianos, Xrysovalantis ;

Kalligeros, Emmanouil ;

Nikolos, Dimitris .

IEEE TRANSACTIONS ON COMPUTERS, 2007, 56 (08) :1146-1152

[7]

Li WL, 2008, INT HIGH LEVEL DESIG, P25, DOI 10.1109/HLDVT.2008.4695869

[8] RL-Huffman encoding for test compression and power reduction in scan applications [J].

Nourani, M ;

Tehranipour, MH .

ACM TRANSACTIONS ON DESIGN AUTOMATION OF ELECTRONIC SYSTEMS, 2005, 10 (01) :91-115

[9]

*SYN INC, 2004, TETRAMAX REF MAN

[10] Survey of test vector compression techniques [J].

Touba, Nur A. .

IEEE DESIGN & TEST OF COMPUTERS, 2006, 23 (04) :294-303

← 1 →