Investigation of series resistance losses by illuminated lock-in thermography

被引：15

作者：

Isenberg, J

van der Heide, ASH

Warta, W

机构：

[1] Fraunhofer Inst Solar Energy Syst, D-79110 Freiburg, Germany

[2] ECN Solar Energy, NL-1755 LE Petten, Netherlands

来源：

PROGRESS IN PHOTOVOLTAICS | 2005年 / 13卷 / 08期

关键词：

solar cell characterization; lock-in thermography; series resistance; contact resistance; metallization;

D O I：

10.1002/pip.633

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

A measurement mode (J(SC)-ILIT) for the recently introduced Illuminated Lock-In Thermography (ILIT) method and a new interpretation of the images obtained is proposed. This mode is especially adapted for the investigation of series resistance, in particular contact resistance, in solar cells. Comparison of J(SC)-ILIT results to emitter potential maps obtained by Corescan demonstrate good agreement between the poorly contacted areas, proving the practical applicability of the technique. J(SC)-ILIT provides a quasi-contactless and fast measurement. Comparison is made with the recently introduced method of R-S-ILIT The capability of both methods to detect series resistance problems is demonstrated. Possible distortions due to inhomogeneities of bulk material quality are discussed. Copyright (c) 2005 John Wiley & Sons, Ltd.

引用

页码：697 / 703

页数：7

共 13 条

[1] Electrothermal simulation of a defect in a solar cell [J].