GSMBE growth of GaInAsP/InP 1.3 μm-TM-lasers for monolithic integration with optical waveguide isolator

被引:3
作者
Lelarge, F
Dagens, B
Cuisin, C
Le Gouezigou, O
Patriarche, G
Van Parys, W
Vanwolleghem, M
Baets, R
Gentner, JL
机构
[1] Alcatel Thales III V Lab, F-91460 Marcoussis, France
[2] CNRS, Lab Photon & Nanostruct, Marcoussis, France
[3] State Univ Ghent, Dept Informat Technol, B-9000 Ghent, Belgium
关键词
gas source molecular beam epitaxy; tensile-strained multiple quantum wells; optical waveguide isolator; TM semiconductor amplifiers;
D O I
10.1016/j.jcrysgro.2004.12.154
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
The GSMBE growth of GaInAsP/InP 1.3-μ m-TM active core and highly p-doped contacting layers required for fabricating an integrated optical waveguide isolator is studied in detail. The deposition of a highly doped 1.17-μ m-GaInAsP:Be contacting layers provide a good electrical contact between the III-V semiconductor and the ferromagnetic metal is reported. The GSMBE growth of strain-compensated GaInAsP multiple-quantum wells (QWs) allows one to stack tip to fifteen 12-nm-thick -1.1% tensile-strained QWs. Broad area TM-lasers with threshold a current density of 0.8k A/cm(2) and characteristic temperature of 75 K (in the range of 20-80 ° C) are obtained for 600 μ m-long lasers comprising 6 QWs. The possible wavelength extension of TM lasers to 1.55-μ m is also discussed. © 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:709 / 713
页数:5
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