Scaling properties of the diffusion process underlying the Havriliak-Negami relaxation function

被引:4
|
作者
Weron, K
Jurlewicz, A
机构
[1] Wroclaw Univ Technol, Inst Phys, PL-50370 Wroclaw, Poland
[2] Wroclaw Univ Technol, Hugo Steinhaus Ctr Stochast Methods, PL-50370 Wroclaw, Poland
[3] Wroclaw Univ Technol, Inst Math, PL-50370 Wroclaw, Poland
来源
DIFFUSION IN MATERIALS: DIMAT 2004, PTS 1 AND 2 | 2005年 / 237-240卷
关键词
relaxation phenomenon; power-law dielectric response; Havriliak-Negami function; continuous-time random walk; limit theorem;
D O I
10.4028/www.scientific.net/DDF.237-240.1093
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We present a generalization of the exponential Debye relaxation based on the continuous-time random walk (CTRW) framework. We show how to modify the random-walk scenario underlying the classical response in order to derive the empirical Havriliak-Negami function, commonly used to fit the experimental relaxation data. The turnover from the exponential Debye to the power-law Havriliak-Negami relaxation response is associated with a new type of a coupled memory CTRW driving a fractional dynamics.
引用
收藏
页码:1093 / 1100
页数:8
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