Two-dimensional displacement measurement by quasi-common-optical-path heterodyne grating interferometer

被引:51
作者
Hsieh, Hung-Lin [1 ,2 ]
Chen, Jyh-Chen [1 ]
Lerondel, Gilles [2 ]
Lee, Ju-Yi [1 ]
机构
[1] Natl Cent Univ, Dept Mech Engn, Jhongli 320, Taoyuan County, Taiwan
[2] Univ Technol Troyes, Lab Nanotechnol & Instrumentat Opt, ICD, CNRS, F-10010 Troyes, France
关键词
ENCODERS;
D O I
10.1364/OE.19.009770
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A method based on a specific quasi-common-optical-path (QCOP) configuration for two-dimensional displacement measurement is presented. The measurement system consists of a heterodyne light source, two-dimensional holographic grating, specially designed set of half wave plates, and lock-in amplifiers. Two measurement configurations, for single and differential detection, are designed. The sensitivity, resolution and nonlinear phase error of the differential detection type are better than those of the single detection type. The experimental results demonstrate that the QCOP interferometer has the ability to measure two-dimensional displacement while maintaining high system stability. (C) 2011 Optical Society of America
引用
收藏
页码:9770 / 9782
页数:13
相关论文
共 14 条
[1]   Reflection optical encoders as three-grating moire systems [J].
Crespo, D ;
Alonso, J ;
Bernabeu, E .
APPLIED OPTICS, 2000, 39 (22) :3805-3813
[2]   Metrological large range scanning probe microscope [J].
Dai, GL ;
Pohlenz, F ;
Danzebrink, HU ;
Xu, M ;
Hasche, K ;
Wilkening, G .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2004, 75 (04) :962-969
[3]  
*H PACK, 1980, 5526A LAS MEAS SYST
[4]   Quasi-common-optical-path heterodyne grating interferometer for displacement measurement [J].
Hsieh, H. L. ;
Lee, J. Y. ;
Wu, W. T. ;
Chen, J. C. ;
Deturche, R. ;
Lerondel, G. .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2010, 21 (11)
[5]  
*L PREC, 2004, LION PREC WHIT PAP 2
[6]   Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution [J].
Lee, Ju-Yi ;
Chen, Hui-Yi ;
Hsu, Cheng-Chih ;
Wu, Chyan-Chyi .
SENSORS AND ACTUATORS A-PHYSICAL, 2007, 137 (01) :185-191
[7]   High stability multiplexed fibre interferometer and its application on absolute displacement measurement and on-line surface metrology [J].
Lin, DJ ;
Jiang, XQ ;
Xie, F ;
Zhang, W ;
Zhang, L ;
Bennion, I .
OPTICS EXPRESS, 2004, 12 (23) :5729-5734
[8]   Doppler writing and linewidth control for scanning beam interference lithography [J].
Montoya, JC ;
Chang, CH ;
Heilmann, RK ;
Schattenburg, ML .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (06) :2640-2645
[9]   A new capacitive sensor for displacement measurement in a surface-force apparatus [J].
Restagno, F ;
Crassous, J ;
Charlaix, E ;
Monchanin, M .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2001, 12 (01) :16-22
[10]   Enlarged atomic force microscopy scanning scope:: Novel sample-holder device with millimeter range [J].
Sinno, A. ;
Ruaux, P. ;
Chassagne, L. ;
Topcu, S. ;
Alayli, Y. ;
Lerondel, G. ;
Blaize, S. ;
Bruyant, A. ;
Royer, P. .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (09)