Interference Effects in the Electroreflectance and Electroluminescence Spectra of InGaN/AlGaN/GaN Light-Emitting-Diode Heterostructures

被引:8
作者
Avakyants, L. P. [1 ]
Bokov, P. Yu. [1 ]
Chervyakov, A. V. [1 ]
Chuyas, A. V. [1 ]
Yunovich, A. E. [1 ]
Vasileva, E. D. [2 ]
Bauman, D. A. [2 ]
Uelin, V. V. [2 ]
Yavich, B. S. [2 ]
机构
[1] Moscow MV Lomonosov State Univ, Fac Phys, Moscow 119991, Russia
[2] JSC Svetlana Optoelect, St Petersburg 194156, Russia
关键词
EFFICIENCY; INTERFACE;
D O I
10.1134/S1063782610080245
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Interference effects in InGaN/AlGaN/GaN light-emitting-diode heterostructures of blue emission are studied by spectroscopy of electroreflectance and electroluminescence. The periodic bands observed in the electroreflectance and electroluminescence spectra in a blue spectral range are caused by interference effects in the structure in general. The emergence of interference fringes in the electroreflection spectra is explained by modulation of built-in electric fields in the active region of the heterostructure. The long-period interference fringes observed in the electroreflectance spectra in a wide spectral range from infrared to ultra-violet allows one to determine the location of the active region of the heterostructure with respect to different reflecting surfaces in the cavity.
引用
收藏
页码:1090 / 1095
页数:6
相关论文
共 15 条
[11]  
SCHUBERT FE, 2008, LIGHT EMITTING DIODE, pCH10
[12]   Determination of piezoelectric fields in strained GaInN quantum wells using the quantum-confined Stark effect [J].
Takeuchi, T ;
Wetzel, C ;
Yamaguchi, S ;
Sakai, H ;
Amano, H ;
Akasaki, I ;
Kaneko, Y ;
Nakagawa, S ;
Yamaoka, Y ;
Yamada, N .
APPLIED PHYSICS LETTERS, 1998, 73 (12) :1691-1693
[13]  
WATANABE N, 2008, P INT WORKSH NITR SE, P487
[14]  
YUNOVICH AE, 2007, MAT RES SOC S, V955
[15]   High-power flip-chip blue light-emitting diodes based on AlGaInN [J].
Zakheim, DA ;
Smirnova, IP ;
Roznanskii, IV ;
Gurevich, SA ;
Kulagina, MM ;
Arakcheeva, EM ;
Onushkin, GA ;
Zakheim, AL ;
Vasil'eva, ED ;
Itkinson, GV .
SEMICONDUCTORS, 2005, 39 (07) :851-855