Interference Effects in the Electroreflectance and Electroluminescence Spectra of InGaN/AlGaN/GaN Light-Emitting-Diode Heterostructures

被引:8
作者
Avakyants, L. P. [1 ]
Bokov, P. Yu. [1 ]
Chervyakov, A. V. [1 ]
Chuyas, A. V. [1 ]
Yunovich, A. E. [1 ]
Vasileva, E. D. [2 ]
Bauman, D. A. [2 ]
Uelin, V. V. [2 ]
Yavich, B. S. [2 ]
机构
[1] Moscow MV Lomonosov State Univ, Fac Phys, Moscow 119991, Russia
[2] JSC Svetlana Optoelect, St Petersburg 194156, Russia
关键词
EFFICIENCY; INTERFACE;
D O I
10.1134/S1063782610080245
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
Interference effects in InGaN/AlGaN/GaN light-emitting-diode heterostructures of blue emission are studied by spectroscopy of electroreflectance and electroluminescence. The periodic bands observed in the electroreflectance and electroluminescence spectra in a blue spectral range are caused by interference effects in the structure in general. The emergence of interference fringes in the electroreflection spectra is explained by modulation of built-in electric fields in the active region of the heterostructure. The long-period interference fringes observed in the electroreflectance spectra in a wide spectral range from infrared to ultra-violet allows one to determine the location of the active region of the heterostructure with respect to different reflecting surfaces in the cavity.
引用
收藏
页码:1090 / 1095
页数:6
相关论文
共 15 条
[1]   Electroreflectance spectra of InGaN/AlGaN/GaN quantum-well heterostructures [J].
Avakyants, L. P. ;
Badgutdinov, M. L. ;
Bokov, P. Yu. ;
Chervyakov, A. V. ;
Shirokov, S. S. ;
Yunovich, A. E. ;
Bogdanov, A. A. ;
Vasil'eva, E. D. ;
Nikolaev, D. A. ;
Feopentov, A. V. .
SEMICONDUCTORS, 2007, 41 (09) :1060-1066
[2]   Computerized setup for double-monochromator photoreflectance spectroscopy [J].
Avakyants, LP ;
Bokov, PY ;
Chervyakov, AV .
TECHNICAL PHYSICS, 2005, 50 (10) :1316-1318
[3]   Emission spectra of InGaN/AlGaN/GaN quantum well heterostructures:: Model of the two-dimensional joint density of states [J].
Badgutdinov, M. L. ;
Yunovich, A. E. .
SEMICONDUCTORS, 2008, 42 (04) :429-438
[4]   Luminescence spectra, efficiency, and color characteristics of white-light-emitting diodes based on p-n InGaN/GaN heterostructures with phosphor coatings [J].
Badgutdinov, M. L. ;
Korobov, E. V. ;
Luk'yanov, F. A. ;
Yunovich, A. E. ;
Kogan, L. M. ;
Gal'china, N. A. ;
Rassokhin, I. T. ;
Soshchin, N. P. .
SEMICONDUCTORS, 2006, 40 (06) :739-744
[5]   Microcavity effects in GaN epitaxial films and in Ag/GaN/sapphire structures [J].
Billeb, A ;
Grieshaber, W ;
Stocker, D ;
Schubert, EF ;
Karlicek, RF .
APPLIED PHYSICS LETTERS, 1997, 70 (21) :2790-2792
[6]   The effects of interface states on the capacitance and electroluminescence efficiency of InGaN/GaN light-emitting diodes [J].
Bochkareva, NI ;
Zhirnov, EA ;
Efremov, AA ;
Rebane, YT ;
Gorbunov, RI ;
Klochkov, AV ;
Lavrinovich, DA ;
Shreter, YG .
SEMICONDUCTORS, 2005, 39 (07) :795-799
[7]  
Born M., 2002, Principles of Optics
[8]   Study of moire fringes at the interface of GaN/α-Al2O3(0001) [J].
Chen, ZZ ;
Shen, B ;
Qin, ZX ;
Zhu, JM ;
Zhang, R ;
Zheng, YD ;
Zhang, GY .
PHYSICA B-CONDENSED MATTER, 2002, 324 (1-4) :59-62
[9]   History, development, and applications of high-brightness visible light-emitting diodes [J].
Dupuis, Russell D. ;
Krames, Michael R. .
JOURNAL OF LIGHTWAVE TECHNOLOGY, 2008, 26 (9-12) :1154-1171
[10]   HETEROINTERFACES IN QUANTUM-WELLS AND EPITAXIAL-GROWTH PROCESSES - EVALUATION BY LUMINESCENCE TECHNIQUES [J].
HERMAN, MA ;
BIMBERG, D ;
CHRISTEN, J .
JOURNAL OF APPLIED PHYSICS, 1991, 70 (02) :R1-R52