CNT-Based MEMS/NEMS Gas Ionizers for Portable Mass Spectrometry Applications

被引:39
作者
Velasquez-Garcia, Luis Fernando [1 ]
Gassend, Blaise Laurent Patrick [2 ]
Akinwande, Akintunde Ibitayo [2 ]
机构
[1] MIT, Microsyst Technol Labs, Cambridge, MA 02139 USA
[2] MIT, Dept Elect Engn & Comp Sci, Cambridge, MA 02139 USA
关键词
Carbon nanotubes (CNTs); deep reactive ion etching (DRIE); electron impact ionization; field emission; gas ionizer; portable mass spectrometry (MS); 3-D MEMS packaging; ELECTRON-IMPACT IONIZATION; MINIATURE QUADRUPOLE; FIELD-EMISSION; ION SOURCES; MICRO; MEMS; PERFORMANCE; FABRICATION; ANALYZER; DETECTOR;
D O I
10.1109/JMEMS.2010.2045639
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report the fabrication and experimental characterization of a carbon nanotube (CNT)-based MEMS/NEMS electron impact gas ionizer with an integrated extractor gate for portable mass spectrometry. The ionizer achieves low-voltage ionization using sparse forests of plasma-enhanced chemical-vapor-deposited CNTs as field emitters and a proximal extractor grid with apertures aligned to the CNT forests to facilitate electron transmission. The extractor gate is integrated to the ionizer using a high-voltage MEMS packaging technology based on Si springs defined by deep reactive ion etching. The ionizer also includes a high-aspect-ratio silicon structure (mu foam) that facilitates sparse CNT growth and also enables uniform current emission. The devices were tested as field emitters in high vacuum (10(-8) torr) and as electron impact ionizers using argon at pressures of up to 21 mtorr. The experimental data show that the MEMS extractor gate transmits up to 66% of the emitted current and that the ionizers are able to produce up to 0.139 mA of ion current with up to 19% ionization efficiency while consuming 0.39W.
引用
收藏
页码:484 / 493
页数:10
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