Operando sum-frequency generation spectroscopy of high-efficiency OLEDs for probing the charge carrier behavior

被引：5

作者：

Miyamae, Takayuki ^{[1
,2
]}

Sato, Tomoya ^{[3
]}

机构：

[1] Chiba Univ, Grad Sch Engn, Chiba, Japan

[2] Chiba Univ, Mol Chiral Res Ctr, Chiba, Japan

[3] Tokyo Univ Sci, Fac Sci & Technol, Dept Phys, Chiba, Japan

来源：

JOURNAL OF THE SOCIETY FOR INFORMATION DISPLAY | 2022年 / 30卷 / 01期

基金：

日本学术振兴会;

关键词：

high-efficiency blue-OLED; OLEDs; operando measurement; sum frequency generation; ALQ(3);

D O I：

10.1002/jsid.1076

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Operando analysis of organic devices is crucial for understanding the device operation mechanism and intrinsic degradation mechanism. Buried organic layers in OLEDs during operation have been investigated using electric-field-induced doubly resonant sum-frequency generation (EFI-DR-SFG) and time-resolved EFI-DR-SFG experiments. The time-resolved EFI-SFG technique allows us to observe the carrier transportation directly and non-destructively. DC electric field leads to a significant increase in the SFG intensity produced by the charged carriers. Electric-field-induced SFG results clearly show that charge accumulation occurs at the interface between the light emitting layer and the electron-blocking layer in the blue OLED and that this charge accumulation strongly contributes for the light emission. Particularly in the TTA process, high charge accumulation is effective in generating triplet excitons and improving the luminescence efficiency, but at the same time, it reduces the lifetime of the device.

引用

页码：3 / 14

页数：12

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