共 50 条
[43]
Transmission electron microscopy study by chemical delineation in Si devices
[J].
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS,
2000, 39 (6A)
:3330-3333
[49]
Comparative study of a block copolymer morphology by transmission electron microscopy and scanning force microscopy
[J].
JOURNAL OF MICROSCOPY-OXFORD,
2002, 205
:106-108