Dynamic strain measurement using an extrinsic Fabry-Perot interferometric sensor and an arrayed waveguide grating device

被引：13

作者：

Willshire, AJ ^{[1
]}

Niewczas, P ^{[1
]}

Dziuda, L ^{[1
]}

Fusiek, G ^{[1
]}

McDonald, JR ^{[1
]}

机构：

[1] Univ Strathclyde, Inst Energy & Environm, Glasgow, Lanark, Scotland

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2004年 / 53卷 / 01期

关键词：

arrayed waveguide grating; extrinsic and intrinsic Fabry-Perot interferometer (EFPI); optical sensor; strain measurement;

D O I：

10.1109/TIM.2003.821480

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, we demonstrate an interrogation system based on an arrayed waveguide grating capable of monitoring dynamic strain in a cantilever beam at frequencies up to 5 kHz (limited by the actuator) with a similar precision to resistive strain gauges.

引用

页码：4 / 9

页数：6