Quantitative and Isolated Measurement of Far-Field Light Scattering by a Single Nanostructure

被引:9
|
作者
Kim, Donghyeong [1 ,2 ]
Jeong, Kwang-Yong [3 ]
Kim, Jinhyung [1 ,2 ]
Ee, Ho-Seok [1 ,2 ]
Kang, Ju-Hyung [3 ]
Park, Hong-Gyu [3 ]
Seo, Min-Kyo [1 ,2 ]
机构
[1] Korea Adv Inst Sci & Technol, Dept Phys, Daejeon 34141, South Korea
[2] Korea Adv Inst Sci & Technol, Inst NanoCentury, Daejeon 34141, South Korea
[3] Korea Univ, Dept Phys, Seoul 02841, South Korea
来源
PHYSICAL REVIEW APPLIED | 2017年 / 8卷 / 05期
基金
新加坡国家研究基金会;
关键词
GENERATION; EMISSION; ANTENNAS;
D O I
10.1103/PhysRevApplied.8.054024
中图分类号
O59 [应用物理学];
学科分类号
摘要
Light scattering by nanostructures has facilitated research on various optical phenomena and applications by interfacing the near fields and free-propagating radiation. However, direct quantitative measurement of far-field scattering by a single nanostructure on the wavelength scale or less is highly challenging. Conventional back-focal-plane imaging covers only a limited solid angle determined by the numerical aperture of the objectives and suffers from optical aberration and distortion. Here, we present a quantitative measurement of the differential far-field scattering cross section of a single nanostructure over the full hemisphere. In goniometer-based far-field scanning with a high signal-to-noise ratio of approximately 27.4 dB, weak scattering signals are efficiently isolated and detected under total-internal-reflection illumination. Systematic measurements reveal that the total and differential scattering cross sections of a Au nanorod are determined by the plasmonic Fabry-Perot resonances and the phase-matching conditions to the free-propagating radiation, respectively. We believe that our angle-resolved far-field measurement scheme provides a way to investigate and evaluate the physical properties and performance of nano-optical materials and phenomena.
引用
收藏
页数:8
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