Antireflective property of thin film a-Si solar cell structures with graded refractive index structure

被引:31
作者
Jang, Sung Jun [1 ]
Song, Young Min [1 ]
Yeo, Chan Il [1 ]
Park, Chang Young [1 ]
Yu, Jae Su [2 ]
Lee, Yong Tak [1 ,3 ,4 ]
机构
[1] Gwangju Inst Sci & Technol, Sch Informat & Commun, 1 Oryong Dong, Kwangju 500712, South Korea
[2] Kyung Hee Univ, Dept Elect & Radio Engn, Yongin 446701, Gyeonggi Do, South Korea
[3] Gwangju Inst Sci & Technol, Grad Program Photon & Appl Phys, Kwangju 500712, South Korea
[4] Gwangju Inst Sci & Technol, Dept Nanobio Elect & Mat, Kwangju 500712, South Korea
关键词
BROAD-BAND; COATINGS; DESIGN;
D O I
10.1364/OE.19.00A108
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
We report the antireflective property of thin film amorphous silicon (a-Si) solar cell structures based on graded refractive index structure together with theoretical analysis. Optimizations of the index profile are performed using the rigorous coupled-wave analysis method. The graded refractive index structure fabricated by oblique angle deposition suppresses optical reflection over a wide range of wavelength and incident angle, compared to the conventional structure. The average reflectance of thin film a-Si solar cell structure with the graded refractive index structure is suppressed by 54% at normal incidence due to the effective refractive index matching between ITO and a-Si, indicating a reasonable agreement with calculated results. (C) 2011 Optical Society of America
引用
收藏
页码:A108 / A117
页数:10
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