Study of uncooled thermal imaging system with multiple working temperatures - art. no. 66211R

An uncooled thermal imaging system with multiple working temperatures will be presented. Transient response performance of a-si microbolometer detectors is simulated firstly when the working temperature varies in the range from -40deg. to +60deg.. Simulating results show that a-si microbolometer detectors have coherent response performance in a large range of working temperature, which lay basis for designing uncooled thermal imaging system with multiple working temperatures. Different from traditional thermal imaging systems, this thermal imaging system has three working temperature with an accuracy range of less than +/- 0.01 deg.. When working, the temperature control circuit will switch between the working temperatures according to the variety of the environmental temperature. To evaluate this thermal imaging system, we measure its power consumption and NETD in the environmental temperature range from -40deg. to +60deg.. The measurement results are that the total power is less than 2500mW and the NETD is less than 120mk. This indicates that the thermal imaging system has nearly the same imaging quality and obviously lower power, compared with traditional thermal imaging systems.