Evaluating superconducting YBCO film properties using X-ray photoelectron spectroscopy

被引:0
|
作者
Barnes, PN [1 ]
Tolliver, JC [1 ]
Haugan, TJ [1 ]
Mukhopadhyay, SM [1 ]
Grant, JT [1 ]
机构
[1] USAF, Res Lab, AFRL PRPG, Wright Patterson AFB, OH 45433 USA
来源
FABRICATION OF LONG-LENGTH AND BULK HIGH TERMPERATURE SUPERCONDUCTORS | 2004年 / 149卷
关键词
D O I
暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Initial results have been recently reported that suggest a potential correlation exists between the full-width-half-maximum (FWHM) of the Y(3d) peak obtained by x-ray photoelectron spectroscopy (XPS) and the critical current density a YBa2CU3O7-x film can carry. In particular, the Y(3d(5/2)) demonstrated a stronger correlation. Transport currents were determined. by the 4-point contact method using the 1 muV/cm criterion. An apparent correlation was also suggested between the Y(3d) FWHM and ac loss data from magnetic susceptibility measurements. In this report, a few additional data points were acquired to further test the usefulness of the correlations. Samples were created by pulsed laser deposition of YBa2CU3O7-x on LaAlO3 substrates.
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页码:23 / 31
页数:9
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