Identification of graphene crystallographic orientation by atomic force microscopy

被引：16

作者：

Almeida, C. M. ^{[1
]}

Carozo, V. ^{[1
,2
]}

Prioli, R. ^{[3
]}

Achete, C. A. ^{[1
,2
]}

机构：

[1] Inst Nacl Metrol Normalizacao & Qualidade Ind INM, Div Mat Metrol, BR-25250020 Duque De Caxias, RJ, Brazil

[2] Univ Fed Rio de Janeiro, Dept Met & Mat Engn, BR-21941972 Rio De Janeiro, Brazil

[3] Pontificia Univ Catolica Rio de Janeiro, Dept Fis, BR-22453900 Rio De Janeiro, Brazil

来源：

JOURNAL OF APPLIED PHYSICS | 2011年 / 110卷 / 08期

关键词：

GRAPHITE; SURFACE; EDGES; SPECTROSCOPY; NANORIBBONS; AFM; AIR;

D O I：

10.1063/1.3642991

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The direct determination of the crystallographic orientation of graphene sheets was performed using lattice resolution atomic force microscopy images. A graphene sample, micromechanically exfoliated onto a SiO(2) substrate showing well defined crystal edges, was imaged in lateral force mode. The lateral force images reveal the periodicity of the graphene hexagonal structure allowing the visualization of the lattice symmetries and determination of the crystal orientation. Crystal edges predominantly formed by zigzag or armchair directions were identified. The nature of the edges was confirmed by Raman spectroscopy. (C) 2011 American Institute of Physics. [doi:10.1063/1.3642991]

引用

页数：3

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